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Paper Abstract and Keywords
Presentation 2018-03-05 14:35
[Poster Presentation] Improvement of SIFT feature-based watermarking method -- Distortion reduction of feature regions by introducing variable magnification ratio --
Masato Hayashi, Masaki Kawamura (Yamaguchi Univ.) EMM2017-78
Abstract (in Japanese) (See Japanese page) 
(in English) The method of Uchida and Kawamura, which uses SIFT feature points, has two problems. 
One is that the pixel values of the feature points are overwritten in the embedding process, since the points are located in the center of the embedding regions. 
The other is that the normalization of the embedding regions is also a cause of distortion, and then the watermarks might be not always extracted from the stego-images. 
In order to solve the problems, we propose two techniques. 
One is a doughnut-shaped embedding region, that is, watermarks are embedded in the normalized region excluding the center block which includes the feature point. 
The other is an introduction of a large magnification ratio for small SIFT feature regions. 
By extracting more feature points from a stego-image, higher error correction can be possible. 
It is important for embedded feature points to be detected at extracting process. 
We evaluated the detection ratio, bit error rate, and image quality for the conventional method and the proposed method. 
As a result, whereas the image quality of the proposed method was unchanged from the conventional one, the detection ratio of the proposed one was twice as much as conventional one, and then the bit error rate could be decreased.
Keyword (in Japanese) (See Japanese page) 
(in English) Watermarking / SIFT / IHC / / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 476, EMM2017-78, pp. 7-12, March 2018.
Paper # EMM2017-78 
Date of Issue 2018-02-26 (EMM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMM  
Conference Date 2018-03-05 - 2018-03-06 
Place (in Japanese) (See Japanese page) 
Place (in English) Naze Community Center (Amami-Shi, Kagoshima) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Image and Sound Quality, Metrics for Perception and Recognition, Human Auditory and Visual System, etc. 
Paper Information
Registration To EMM 
Conference Code 2018-03-EMM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Improvement of SIFT feature-based watermarking method 
Sub Title (in English) Distortion reduction of feature regions by introducing variable magnification ratio 
Keyword(1) Watermarking  
Keyword(2) SIFT  
Keyword(3) IHC  
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1st Author's Name Masato Hayashi  
1st Author's Affiliation Yamaguchi University (Yamaguchi Univ.)
2nd Author's Name Masaki Kawamura  
2nd Author's Affiliation Yamaguchi University (Yamaguchi Univ.)
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Speaker Author-1 
Date Time 2018-03-05 14:35:00 
Presentation Time 60 minutes 
Registration for EMM 
Paper # EMM2017-78 
Volume (vol) vol.117 
Number (no) no.476 
Page pp.7-12 
#Pages
Date of Issue 2018-02-26 (EMM) 


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