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Paper Abstract and Keywords
Presentation 2018-04-13 15:25
A Compact Countermeasure against Laser-Fault-Injection Attack Utilizing Bulk-Current Sensor and Instantaneous Supply-Shunt Circuit
Kohei Matsuda (Kobe Univ.), Tatsuya Fujii, Shoji Natsu, Takeshi Sugawara, Kazuo Sakiyama (UCE), Yu-ichi Hayashi (NAIST), Makoto Nagata, Noriyuki Miura (Kobe Univ.) HWS2018-8
Abstract (in Japanese) (See Japanese page) 
(in English) A compact sense-and-reacts countermeasure is proposed against laser fault injection attack on cryptographic processors. A distributed bulk-current sensor detects laser irradiation on flip-flop in cryptographic cores by monitoring abnormal transient bulk current. After the attack detection, the cryptographic core supply is immediately cut off for erasing internal faulty data. A protected AES core in 0.18$mu$m can disable a laser fault injection attack with only +28% layout area penalty compared with unprotected AES core.
Keyword (in Japanese) (See Japanese page) 
(in English) Hardware Security / Laser Fault Injection Attack / AES / / / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 3, HWS2018-8, pp. 41-44, April 2018.
Paper # HWS2018-8 
Date of Issue 2018-04-06 (HWS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF HWS2018-8

Conference Information
Committee HWS  
Conference Date 2018-04-13 - 2018-04-13 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To HWS 
Conference Code 2018-04-HWS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Compact Countermeasure against Laser-Fault-Injection Attack Utilizing Bulk-Current Sensor and Instantaneous Supply-Shunt Circuit 
Sub Title (in English)  
Keyword(1) Hardware Security  
Keyword(2) Laser Fault Injection Attack  
Keyword(3) AES  
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1st Author's Name Kohei Matsuda  
1st Author's Affiliation Kobe University (Kobe Univ.)
2nd Author's Name Tatsuya Fujii  
2nd Author's Affiliation The University of Electro-Communications (UCE)
3rd Author's Name Shoji Natsu  
3rd Author's Affiliation The University of Electro-Communications (UCE)
4th Author's Name Takeshi Sugawara  
4th Author's Affiliation The University of Electro-Communications (UCE)
5th Author's Name Kazuo Sakiyama  
5th Author's Affiliation The University of Electro-Communications (UCE)
6th Author's Name Yu-ichi Hayashi  
6th Author's Affiliation Nara Institute of Science and Technology (NAIST)
7th Author's Name Makoto Nagata  
7th Author's Affiliation Kobe University (Kobe Univ.)
8th Author's Name Noriyuki Miura  
8th Author's Affiliation Kobe University (Kobe Univ.)
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Speaker Author-1 
Date Time 2018-04-13 15:25:00 
Presentation Time 25 minutes 
Registration for HWS 
Paper # HWS2018-8 
Volume (vol) vol.118 
Number (no) no.3 
Page pp.41-44 
#Pages 4 
Date of Issue 2018-04-06 (HWS) 

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