Paper Abstract and Keywords |
Presentation |
2019-02-27 13:40
State Assignment Method to Improve Transition Fault Coverage for Datapath Masayoshi Yoshimura (Kyoto Sangyo Univ.), Yuki Takeuchi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.) DC2018-78 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Recently, it is indispensable to test in transition fault model due to timing defects increase along with complication and high speed of VLSI. However, the transition fault coverage tends to be lower than the stuck-at fault coverage due to untestable faults caused by the circuit structure. Therefore, there is a possibility of missing a potential failure for timing defects. Therefore, it is important to design-for-testability (DFT) to improve fault coverage in the transition fault model. In this paper, we show that transition fault coverages depend on state assignment to a controller in RTL netlist. We propose a QDT set which is an evaluation index on transition fault coverage for state assignment. Experimental results show that state assignment with high evaluation index has high transition fault coverages. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
transition fault / fault coverage / state assignment / QDT / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 118, no. 456, DC2018-78, pp. 43-48, Feb. 2019. |
Paper # |
DC2018-78 |
Date of Issue |
2019-02-20 (DC) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2018-78 |
Conference Information |
Committee |
DC |
Conference Date |
2019-02-27 - 2019-02-27 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
VLSI Design and Test, etc. |
Paper Information |
Registration To |
DC |
Conference Code |
2019-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
State Assignment Method to Improve Transition Fault Coverage for Datapath |
Sub Title (in English) |
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Keyword(1) |
transition fault |
Keyword(2) |
fault coverage |
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state assignment |
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QDT |
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1st Author's Name |
Masayoshi Yoshimura |
1st Author's Affiliation |
Kyoto Sangyo University (Kyoto Sangyo Univ.) |
2nd Author's Name |
Yuki Takeuchi |
2nd Author's Affiliation |
Nihon University (Nihon Univ.) |
3rd Author's Name |
Hiroshi Yamazaki |
3rd Author's Affiliation |
Nihon University (Nihon Univ.) |
4th Author's Name |
Toshinori Hosokawa |
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Nihon University (Nihon Univ.) |
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Speaker |
Author-1 |
Date Time |
2019-02-27 13:40:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2018-78 |
Volume (vol) |
vol.118 |
Number (no) |
no.456 |
Page |
pp.43-48 |
#Pages |
6 |
Date of Issue |
2019-02-20 (DC) |
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