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Paper Abstract and Keywords
Presentation 2019-02-27 10:15
Analysis of the hotspot distribution in the LSI
Yudai Kawano, Kohei Miyase (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2018-74
Abstract (in Japanese) (See Japanese page) 
(in English) Performance degrading caused by high IR-drop in normal functional mode of LSI can be solved by improving power supply network in layout design phase. However, excessive IR-drop in test mode is not appropriately considered in layout design phase, although the amount of increased IR-drop in test mode is much higher than in normal functional mode. Excessive IR-drop in test mode causes test malfunction which judges fault free LSI in normal functional mode as faulty. In this work, we propose a method to locate high IR-drop areas (Hot Spot) which is necessary to effectively and efficiently reduce excessive IR-drop.
Keyword (in Japanese) (See Japanese page) 
(in English) at-speed testing / test power / IR-drop / over-testing / / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 456, DC2018-74, pp. 19-24, Feb. 2019.
Paper # DC2018-74 
Date of Issue 2019-02-20 (DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2019-02-27 - 2019-02-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) VLSI Design and Test, etc. 
Paper Information
Registration To DC 
Conference Code 2019-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Analysis of the hotspot distribution in the LSI 
Sub Title (in English)  
Keyword(1) at-speed testing  
Keyword(2) test power  
Keyword(3) IR-drop  
Keyword(4) over-testing  
1st Author's Name Yudai Kawano  
1st Author's Affiliation Kyushu Institute of Technology (Kyutech)
2nd Author's Name Kohei Miyase  
2nd Author's Affiliation Kyushu Institute of Technology (Kyutech)
3rd Author's Name Shyue-Kung Lu  
3rd Author's Affiliation National Taiwan University of Science & Technology (NTUST)
4th Author's Name Xiaoqing Wen  
4th Author's Affiliation Kyushu Institute of Technology (Kyutech)
5th Author's Name Seiji Kajihara  
5th Author's Affiliation Kyushu Institute of Technology (Kyutech)
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Speaker Author-1 
Date Time 2019-02-27 10:15:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2018-74 
Volume (vol) vol.118 
Number (no) no.456 
Page pp.19-24 
Date of Issue 2019-02-20 (DC) 

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