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Paper Abstract and Keywords
Presentation 2019-08-07 16:30
[Invited Talk] High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SGMONOS flash memory for security applications
Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics) SDM2019-39 ICD2019-4
Abstract (in Japanese) (See Japanese page) 
(in English) Highly reliable Physical Unclonable Functions (PUF) based on 28nm Split-Gate MONOS (SG-MONOS) embedded flash memory is developed for hardware security applications. In this paper, we investigate wide range tolerance on applied voltage, temperature and aging influence for basic PUF characteristics utilizing SG-MONOS initial Vt variation. High-temperature stable PUF at the junction temperature (Tj) of 170oC can be confirmed by applying widely used automotive quality SG-MONOS flash memory. In addition, newly implemented offset read scheme achieves 0% error rate for PUF reliability without ECC.
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Reference Info. IEICE Tech. Rep., vol. 119, no. 161, SDM2019-39, pp. 15-19, Aug. 2019.
Paper # SDM2019-39 
Date of Issue 2019-07-31 (SDM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2019-39 ICD2019-4

Conference Information
Committee SDM ICD ITE-IST  
Conference Date 2019-08-07 - 2019-08-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ., Graduate School /Faculty of Information Science and 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications 
Paper Information
Registration To SDM 
Conference Code 2019-08-SDM-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SGMONOS flash memory for security applications 
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1st Author's Name Takahiro Shimoi  
1st Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
2nd Author's Name Tomoya Saito  
2nd Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
3rd Author's Name Hirokazu Nagase  
3rd Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
4th Author's Name Masayuki Izuna  
4th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
5th Author's Name Akihiko Kanda  
5th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
6th Author's Name Takashi Ito  
6th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
7th Author's Name Takashi Kono  
7th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
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Speaker Author-1 
Date Time 2019-08-07 16:30:00 
Presentation Time 45 minutes 
Registration for SDM 
Paper # SDM2019-39, ICD2019-4 
Volume (vol) vol.119 
Number (no) no.161(SDM), no.162(ICD) 
Page pp.15-19 
#Pages 5 
Date of Issue 2019-07-31 (SDM, ICD) 

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