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| Presentation | 2019-08-08 10:00 Application of Extreme Value Theory to Statistical Analyses of Worst Case SRAM Data Retention Voltage Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto (Univ. of Tokyo)  SDM2019-41 ICD2019-6 Link to ES Tech. Rep. Archives: SDM2019-41 ICD2019-6 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The extreme value theory was applied to the estimation of the maximum SRAM data retention voltage (DRV). It was found that, using a device matrix array (DMA) TEG with bulk 6T SRAM cells fabricated by the 65 nm technology, the block maximum DRV of SRAM arrays follows a Gumbel distribution. This method makes it possible to estimate the maximum DRV of large scale SRAMs simply by measuring several SRAM array blocks without measuring all the SRAM arrays. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | SRAM / data retention voltage / extreme value theory / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 119, no. 161, SDM2019-41, pp. 27-30, Aug. 2019. | |
| Paper # | SDM2019-41 | |
| Date of Issue | 2019-07-31 (SDM, ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SDM2019-41 ICD2019-6 Link to ES Tech. Rep. Archives: SDM2019-41 ICD2019-6 |
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| Conference Information | |
| Committee | SDM ICD ITE-IST |
| Conference Date | 2019-08-07 - 2019-08-09 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Hokkaido Univ., Graduate School /Faculty of Information Science and |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications |
| Paper Information | |
| Registration To | SDM |
| Conference Code | 2019-08-SDM-ICD-IST |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Application of Extreme Value Theory to Statistical Analyses of Worst Case SRAM Data Retention Voltage |
| Sub Title (in English) | |
| Keyword(1) | SRAM |
| Keyword(2) | data retention voltage |
| Keyword(3) | extreme value theory |
| Keyword(4) | |
| Keyword(5) | |
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| 1st Author's Name | Tomoko Mizutani |
| 1st Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 2nd Author's Name | Kiyoshi Takeuchi |
| 2nd Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 3rd Author's Name | Takuya Saraya |
| 3rd Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 4th Author's Name | Masaharu Kobayashi |
| 4th Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
| 5th Author's Name | Toshiro Hiramoto |
| 5th Author's Affiliation | The University of Tokyo (Univ. of Tokyo) |
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| Speaker | Author-1 |
| Date Time | 2019-08-08 10:00:00 |
| Presentation Time | 25 minutes |
| Registration for | SDM |
| Paper # | SDM2019-41, ICD2019-6 |
| Volume (vol) | vol.119 |
| Number (no) | no.161(SDM), no.162(ICD) |
| Page | pp.27-30 |
| #Pages | 4 |
| Date of Issue | 2019-07-31 (SDM, ICD) |
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