IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2019-08-09 13:30
Construction of measurement system for radiation patterns of intrinsic-Josephson junction THz-wave oscillators
Teppei Eguchi, Takashi Tachiki, Takashi Uchida (NDA) SCE2019-14 Link to ES Tech. Rep. Archives: SCE2019-14
Abstract (in Japanese) (See Japanese page) 
(in English) A radiation–pattern measurement system consisting of cryogenic horizontal and vertical rotators was constructed for measuring actual radiation patterns of intrinsic-Josephson-junction THz-wave oscillators. Although the rotators prevented a sample holder from cooling, a Bi2Sr2CaCu2O8+δ mesa was cooled down to 30 K near the operating temperature of the oscillator by connecting the holder to a cold head in a cryocooler through Cu-meshed wires. Moreover, for a voltage of 30 V applied to a piezo actuator in the horizontal rotator and a frequency of 200 Hz for stepping motion, the rotation speed decreased with decreasing in temperature. Under this condition for the applied voltage and step frequency, an interval between measured angles was 0.14 ° - 0.29 °, which are low enough to measure radiation patterns, in the range between 30 and 53 K.
Keyword (in Japanese) (See Japanese page) 
(in English) Josephson Junctions / terahertz wave / oscillator / radiation pattern / / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 164, SCE2019-14, pp. 31-35, Aug. 2019.
Paper # SCE2019-14 
Date of Issue 2019-08-02 (SCE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SCE2019-14 Link to ES Tech. Rep. Archives: SCE2019-14

Conference Information
Committee SCE  
Conference Date 2019-08-09 - 2019-08-09 
Place (in Japanese) (See Japanese page) 
Place (in English) National Institute of Advanced Industrial Science and Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Device, think film, etc. 
Paper Information
Registration To SCE 
Conference Code 2019-08-SCE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Construction of measurement system for radiation patterns of intrinsic-Josephson junction THz-wave oscillators 
Sub Title (in English)  
Keyword(1) Josephson Junctions  
Keyword(2) terahertz wave  
Keyword(3) oscillator  
Keyword(4) radiation pattern  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Teppei Eguchi  
1st Author's Affiliation National Defense Academy (NDA)
2nd Author's Name Takashi Tachiki  
2nd Author's Affiliation National Defense Academy (NDA)
3rd Author's Name Takashi Uchida  
3rd Author's Affiliation National Defense Academy (NDA)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2019-08-09 13:30:00 
Presentation Time 25 minutes 
Registration for SCE 
Paper # SCE2019-14 
Volume (vol) vol.119 
Number (no) no.164 
Page pp.31-35 
#Pages
Date of Issue 2019-08-02 (SCE) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan