Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2019-09-06 11:40
Efficient Reliability Evaluation of Multi-Domain Networks with Secure Intra-Domain Privacy
Atsushi Taniguchi, Takeru Inoue, Kohei Mizuno (NTT), Takashi Kurimoto, Atsuko Takefusa, Shigeo Urushidani (NII) CS2019-55
Abstract (in Japanese) (See Japanese page) 
(in English) Communication networks are now an essential infrastructure of society. Many services are constructed across multiple network domains. Therefore, the reliability of multi-domain networks should be evaluated to assess the sustainability of our society, but there is no known method for evaluating it. One reason is the high computation complexity; i.e., network reliability evaluation is known to be #P-complete, which has prevented the reliability evaluation of multi-domain networks. The other reason is intra-domain privacy; i.e., network providers never disclose the internal data required for reliability evaluation. This paper proposes a novel method that distributedly computes the lower and upper bounds of the reliability without requiring privacy disclosure. Our method is solidly based on graph theory, and is supported by a simple protocol that secures intra-domain privacy. Experiments on real datasets show that our method can successfully compute the reliability for 14-domain networks in one second. The reliability is bounded with reasonable errors; e.g., bound gaps are less than 0.1% for reliable networks.
Keyword (in Japanese) (See Japanese page) 
(in English) Network reliability / inter-domain networks / graph theory / / / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 196, CS2019-55, pp. 45-50, Sept. 2019.
Paper # CS2019-55 
Date of Issue 2019-08-29 (CS) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CS2019-55

Conference Information
Committee NS IN CS NV  
Conference Date 2019-09-05 - 2019-09-06 
Place (in Japanese) (See Japanese page) 
Place (in English) Research Institute of Electrical Communication, Tohoku Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Session management (SIP/IMS), Interoperability/Standardization, NGN/NwGN/Future networks, Cloud/Data center networks, SDN (OpenFlow, etc.)/NFV, IPv6, Machine learning, etc. 
Paper Information
Registration To CS 
Conference Code 2019-09-NS-IN-CS-NV 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Efficient Reliability Evaluation of Multi-Domain Networks with Secure Intra-Domain Privacy 
Sub Title (in English)  
Keyword(1) Network reliability  
Keyword(2) inter-domain networks  
Keyword(3) graph theory  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Atsushi Taniguchi  
1st Author's Affiliation NTT Network Innovation Laboratories (NTT)
2nd Author's Name Takeru Inoue  
2nd Author's Affiliation NTT Network Innovation Laboratories (NTT)
3rd Author's Name Kohei Mizuno  
3rd Author's Affiliation NTT Network Innovation Laboratories (NTT)
4th Author's Name Takashi Kurimoto  
4th Author's Affiliation National Institute of Informatics (NII)
5th Author's Name Atsuko Takefusa  
5th Author's Affiliation National Institute of Informatics (NII)
6th Author's Name Shigeo Urushidani  
6th Author's Affiliation National Institute of Informatics (NII)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2019-09-06 11:40:00 
Presentation Time 25 minutes 
Registration for CS 
Paper # CS2019-55 
Volume (vol) vol.119 
Number (no) no.196 
Page pp.45-50 
#Pages 6 
Date of Issue 2019-08-29 (CS) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan