Paper Abstract and Keywords |
Presentation |
2019-10-24 13:15
Optical Response Analysis of Mixed Thin Films
-- Relationship Between Thin Film Structure and Plazmon Excitation in Kretschmann Arrangement -- Tomohiro Tamaru, Di Wu, Seiya Kishimoto, Yoshito Ashizawa, Katsuji Nakagawa, Shinichiro Ohnuki (Nihon Univ) EMCJ2019-44 MW2019-73 EST2019-52 Link to ES Tech. Rep. Archives: MW2019-73 EST2019-52 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Electromagnetic field simulation using mixed thin films in the kretschmann configuration is important for understanding optical response of various media consisted of mixed thin films. In this paper, electromagnetic field analysis of kretschmann arrangement using mixed thin film composed of multiple metallic media is performed, and the structure and numerical model of mixed thin film are studied. The FDFD (Finite-Difference Frequency-Domain) method is used for electromagnetic field analysis. The mixed thin film consisted of multiple metal media are spatially arranged according to the composition ratio and a structure in which a single metal thin film is arranged as a mixed medium, and the analysis results are compared. Optical responses are investigated in terms of reflectivity and plasmon excitation. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Kretschmann Arrangement / Finite-Difference Frequency-Domain Method / / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 119, no. 243, EST2019-52, pp. 45-48, Oct. 2019. |
Paper # |
EST2019-52 |
Date of Issue |
2019-10-17 (EMCJ, MW, EST) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
EMCJ2019-44 MW2019-73 EST2019-52 Link to ES Tech. Rep. Archives: MW2019-73 EST2019-52 |
Conference Information |
Committee |
EMCJ MW EST IEE-EMC |
Conference Date |
2019-10-24 - 2019-10-25 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Tohoku Gakuin University(Conf. Room 2, Eng. Bldg. 1) |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
EMC, Microwave, Electromagnetic field simulation. |
Paper Information |
Registration To |
EST |
Conference Code |
2019-10-EMCJ-MW-EST-EMC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Optical Response Analysis of Mixed Thin Films |
Sub Title (in English) |
Relationship Between Thin Film Structure and Plazmon Excitation in Kretschmann Arrangement |
Keyword(1) |
Kretschmann Arrangement |
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Finite-Difference Frequency-Domain Method |
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1st Author's Name |
Tomohiro Tamaru |
1st Author's Affiliation |
Nihon University (Nihon Univ) |
2nd Author's Name |
Di Wu |
2nd Author's Affiliation |
Nihon University (Nihon Univ) |
3rd Author's Name |
Seiya Kishimoto |
3rd Author's Affiliation |
Nihon University (Nihon Univ) |
4th Author's Name |
Yoshito Ashizawa |
4th Author's Affiliation |
Nihon University (Nihon Univ) |
5th Author's Name |
Katsuji Nakagawa |
5th Author's Affiliation |
Nihon University (Nihon Univ) |
6th Author's Name |
Shinichiro Ohnuki |
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Nihon University (Nihon Univ) |
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Speaker |
Author-1 |
Date Time |
2019-10-24 13:15:00 |
Presentation Time |
20 minutes |
Registration for |
EST |
Paper # |
EMCJ2019-44, MW2019-73, EST2019-52 |
Volume (vol) |
vol.119 |
Number (no) |
no.241(EMCJ), no.242(MW), no.243(EST) |
Page |
pp.45-48 |
#Pages |
4 |
Date of Issue |
2019-10-17 (EMCJ, MW, EST) |
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