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| Presentation | 2019-12-20 16:30 Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU)  DC2019-85 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measurement in-field is useful for not only fault detection but also fault prediction for such faults. An on-chip delay measurement method based on BIST (Built-In Self-Test) with variable test clock generation has been proposed. In this work experiments using a test chip of the delay measurement circuit was done for observing aging phenomenon in long-term reliability test. Aging is accelerated by exposing the chip to high stress condition such as high temperature and high voltage. The effectiveness of degradation detection using the on-chip delay measurement circuit is discussed by evaluation with long-term reliability test. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Field test / Logic BIST / Delay measurement / Degradation detection / Long-term reliability test / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 119, no. 351, DC2019-85, pp. 37-42, Dec. 2019. | |
| Paper # | DC2019-85 | |
| Date of Issue | 2019-12-13 (DC) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2019-85 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2019-12-20 - 2019-12-20 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2019-12-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test |
| Sub Title (in English) | |
| Keyword(1) | Field test |
| Keyword(2) | Logic BIST |
| Keyword(3) | Delay measurement |
| Keyword(4) | Degradation detection |
| Keyword(5) | Long-term reliability test |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Yousuke Miyake |
| 1st Author's Affiliation | Kyushu Institute of Technology (Kyutech) |
| 2nd Author's Name | Takaaki Kato |
| 2nd Author's Affiliation | Kyushu Institute of Technology (Kyutech) |
| 3rd Author's Name | Seiji Kajihara |
| 3rd Author's Affiliation | Kyushu Institute of Technology (Kyutech) |
| 4th Author's Name | Masao Aso |
| 4th Author's Affiliation | Syswave Corp. (Syswave) |
| 5th Author's Name | Haruji Futami |
| 5th Author's Affiliation | Syswave Corp. (Syswave) |
| 6th Author's Name | Satoshi Matsunaga |
| 6th Author's Affiliation | Syswave Corp. (Syswave) |
| 7th Author's Name | Yukiya Miura |
| 7th Author's Affiliation | Tokyo Metropolitan University (TMU) |
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| Speaker | Author-1 |
| Date Time | 2019-12-20 16:30:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2019-85 |
| Volume (vol) | vol.119 |
| Number (no) | no.351 |
| Page | pp.37-42 |
| #Pages | 6 |
| Date of Issue | 2019-12-13 (DC) |
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