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Paper Abstract and Keywords
Presentation 2020-02-14 13:35
Trend on standardization of Dependability -- Outline of IEC TC 56 2016 Sydney international meeting and drafts from Japan --
Hiroyuki Goto (FDK), Yoshinobu Sato (The IHQI, Tokyo Healthcare Foundation), Fumiaki Harada (D-Tech Partners), Yoshiki Kinoshita (Kanagawa University) R2019-54 EMD2019-54
Abstract (in Japanese) (See Japanese page) 
(in English) IEC/TC 56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Shanghai, China from October 21th to October 25th, 2019. The delegations of 9 counties including 4 Japanese representatives participated. This paper reports the discussions during the meeting, including two projects proposed by Japan's national committee.
Keyword (in Japanese) (See Japanese page) 
(in English) IEC TC 56 / Dependability / Reliability / Risk / Safety / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 411, R2019-54, pp. 1-6, Feb. 2020.
Paper # R2019-54 
Date of Issue 2020-02-07 (R, EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2019-54 EMD2019-54

Conference Information
Committee EMD R  
Conference Date 2020-02-14 - 2020-02-14 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2020-02-EMD-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Trend on standardization of Dependability 
Sub Title (in English) Outline of IEC TC 56 2016 Sydney international meeting and drafts from Japan 
Keyword(1) IEC TC 56  
Keyword(2) Dependability  
Keyword(3) Reliability  
Keyword(4) Risk  
Keyword(5) Safety  
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1st Author's Name Hiroyuki Goto  
1st Author's Affiliation FDK CORPORATION (FDK)
2nd Author's Name Yoshinobu Sato  
2nd Author's Affiliation Institute for Healthcare Quality Improvement, Tokyo Healthcare Foundation (The IHQI, Tokyo Healthcare Foundation)
3rd Author's Name Fumiaki Harada  
3rd Author's Affiliation D-Tech Partners (D-Tech Partners)
4th Author's Name Yoshiki Kinoshita  
4th Author's Affiliation Kanagawa University (Kanagawa University)
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Speaker Author-1 
Date Time 2020-02-14 13:35:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2019-54, EMD2019-54 
Volume (vol) vol.119 
Number (no) no.411(R), no.412(EMD) 
Page pp.1-6 
#Pages 6 
Date of Issue 2020-02-07 (R, EMD) 

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