IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2020-03-05 09:45
Improvement of Road Damage Detection Method Based on Deep Learning
Naoki Wada, Masaru Takeuchi, Kenji Kanai, Jiro Katto (Waseda Univ.) IMQ2019-14 IE2019-96 MVE2019-35
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, automatic road damage detection is required because many Japanese roads need to be repaired due to infrastructure aging problem. As related study, Road Damage Detector is proposed, and this approach adopts deep learning methods, such as SSD-Inception and SSD-MobileNet, in order to detect road damages from images captured by smartphones. However, we confirm that this method indicates low recall values through evaluation. To provide more reliable road damage detection, we study a method that combines YOLO and MobileNet.
Keyword (in Japanese) (See Japanese page) 
(in English) Deep Learning / Road Damage Detecion / Image Processing / / / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 456, IE2019-96, pp. 3-8, March 2020.
Paper # IE2019-96 
Date of Issue 2020-02-27 (IMQ, IE, MVE) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF IMQ2019-14 IE2019-96 MVE2019-35

Conference Information
Committee IE IMQ MVE CQ  
Conference Date 2020-03-05 - 2020-03-06 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyushu Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To IE 
Conference Code 2020-03-IE-IMQ-MVE-CQ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Improvement of Road Damage Detection Method Based on Deep Learning 
Sub Title (in English)  
Keyword(1) Deep Learning  
Keyword(2) Road Damage Detecion  
Keyword(3) Image Processing  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Naoki Wada  
1st Author's Affiliation Waseda University (Waseda Univ.)
2nd Author's Name Masaru Takeuchi  
2nd Author's Affiliation Waseda University (Waseda Univ.)
3rd Author's Name Kenji Kanai  
3rd Author's Affiliation Waseda University (Waseda Univ.)
4th Author's Name Jiro Katto  
4th Author's Affiliation Waseda University (Waseda Univ.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2020-03-05 09:45:00 
Presentation Time 25 minutes 
Registration for IE 
Paper # IMQ2019-14, IE2019-96, MVE2019-35 
Volume (vol) vol.119 
Number (no) no.454(IMQ), no.456(IE), no.457(MVE) 
Page pp.3-8 
#Pages
Date of Issue 2020-02-27 (IMQ, IE, MVE) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan