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Presentation 2020-05-15 15:25
Experimental Results on Ethernet Communication Degradation by Pulse Disturbances (Part 1) -- 100BASE-TX and 1000BASE-T --
Minseong Lee, Yusuke Yano, Osami Wada (Kyoto Univ.) EMCJ2020-9
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, Ethernet communications have been attracting attention as high-speed and large-capacity communication methods with an increase in the amount of information handled in in-vehicle networks. Immunity tests are required to ensure the reliability and safety of in-vehicle communication devices. Although pulse disturbances used for in-vehicle Ethernet immunity tests have been specified, the characteristics of disturbances that cause communication quality degradation and the cause of malfunction that occur when disturbances are applied have not been elucidated. To improve the immunity test reliability and shorten the test time, it is necessary to elucidate the relation between communication quality and parameters of disturbances and the mechanism of malfunction caused by pulse disturbances. In this report, as an early study, we focus on the consumer Ethernet communication standards 100BASE-TX and 1000BASE-T. To investigate the relation between the pulse parameters and communication quality and the mechanism, we conducted an experiment to apply pulse disturbances in differential mode to the differential communication lines. As a result, we found the differences in the parameters of the pulse disturbances to cause degradation of communication quality. Also, the data errors were observed that were inferred to result from different mechanisms in each standard.
Keyword (in Japanese) (See Japanese page) 
(in English) Ethernet / Pulse disturbance / 100BASE-TX / 1000BASE-T / Immunity / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 20, EMCJ2020-9, pp. 27-32, May 2020.
Paper # EMCJ2020-9 
Date of Issue 2020-05-08 (EMCJ) 
ISSN Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2020-05-15 - 2020-05-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) EMC 
Paper Information
Registration To EMCJ 
Conference Code 2020-05-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Experimental Results on Ethernet Communication Degradation by Pulse Disturbances (Part 1) 
Sub Title (in English) 100BASE-TX and 1000BASE-T 
Keyword(1) Ethernet  
Keyword(2) Pulse disturbance  
Keyword(3) 100BASE-TX  
Keyword(4) 1000BASE-T  
Keyword(5) Immunity  
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1st Author's Name Minseong Lee  
1st Author's Affiliation Kyoto University (Kyoto Univ.)
2nd Author's Name Yusuke Yano  
2nd Author's Affiliation Kyoto University (Kyoto Univ.)
3rd Author's Name Osami Wada  
3rd Author's Affiliation Kyoto University (Kyoto Univ.)
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Speaker Author-1 
Date Time 2020-05-15 15:25:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2020-9 
Volume (vol) vol.120 
Number (no) no.20 
Page pp.27-32 
#Pages
Date of Issue 2020-05-08 (EMCJ) 


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