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Paper Abstract and Keywords
Presentation 2020-07-17 13:30
Device identification based on RF circuit imperfections
Taisei Nakada, Ryota Shinoda, Yuichi Miyaji, Hideyuki Uehara (TUT) CS2020-31
Abstract (in Japanese) (See Japanese page) 
(in English) In this report we introduce device identification based on physical information specific to wireless devices, which is a promising technique for enhancing IoT security. The first method uses nonlinear distortions caused by power amplifiers (PAs) as a feature value using a Logarithmic-Swept Sine wave (Log-SS) signal, which is a signal for measuring impulse response. The other one uses the frequency offset and I/Q imbalance as a feature value extracted from the received I/Q signal. With these methods, we obtained high identification accuracy with 11 software radios or 17 ZigBee devices.
Keyword (in Japanese) (See Japanese page) 
(in English) Device identification / IoT / Physical layer security / nonlinear distortion / Frequency offset / I/Q imbalance / Machine learning /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 107, CS2020-31, pp. 61-66, July 2020.
Paper # CS2020-31 
Date of Issue 2020-07-09 (CS) 
ISSN Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CS2020-31

Conference Information
Committee CS  
Conference Date 2020-07-16 - 2020-07-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Ripura(Rishiri Fuji) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Next Generation Networks, Access Networks, Broadband Access, Power Line Communications, Wireless Communication Systems, Coding Systems, etc. 
Paper Information
Registration To CS 
Conference Code 2020-07-CS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Device identification based on RF circuit imperfections 
Sub Title (in English)  
Keyword(1) Device identification  
Keyword(2) IoT  
Keyword(3) Physical layer security  
Keyword(4) nonlinear distortion  
Keyword(5) Frequency offset  
Keyword(6) I/Q imbalance  
Keyword(7) Machine learning  
1st Author's Name Taisei Nakada  
1st Author's Affiliation Toyohashi University of Technology (TUT)
2nd Author's Name Ryota Shinoda  
2nd Author's Affiliation Toyohashi University of Technology (TUT)
3rd Author's Name Yuichi Miyaji  
3rd Author's Affiliation Toyohashi University of Technology (TUT)
4th Author's Name Hideyuki Uehara  
4th Author's Affiliation Toyohashi University of Technology (TUT)
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Speaker Author-4 
Date Time 2020-07-17 13:30:00 
Presentation Time 20 minutes 
Registration for CS 
Paper # CS2020-31 
Volume (vol) vol.120 
Number (no) no.107 
Page pp.61-66 
Date of Issue 2020-07-09 (CS) 

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