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Paper Abstract and Keywords
Presentation 2020-11-19 15:20
[Invited Talk] A technique for phase-detection auto focus under near-infrared-ray incidence in a back-side illuminated CMOS image sensor pixel
Tatsuya Kunikiyo, Hidenori Sato, Takeshi Kamino, Koji Iizuka, Ken'ichiro Sonoda, Tomohiro Yamashita (Renesas Electronics) SDM2020-26
Abstract (in Japanese) (See Japanese page) 
(in English) A novel phase-detection auto focus (PDAF) technique for incident 850 nm plane wave is demonstrated using Ge-on-Si layer and deep trench isolation (DTI), which are locally arranged on light receiving surface (LRS) of crystalline silicon (c-Si). No metal light shielding film (LSF) for pupil division is formed. The key concept of the present work for PDAF is to perform the pupil division by the locally arranged Ge-on-Si layer in a pixel according to incident angle. The present technique can enhance the accuracy of AF under low-illuminated condition.
Keyword (in Japanese) (See Japanese page) 
(in English) phase-detection auto focus / near infrared ray / Ge-on-Si / image sensor pixel / / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 239, SDM2020-26, pp. 21-24, Nov. 2020.
Paper # SDM2020-26 
Date of Issue 2020-11-12 (SDM) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2020-26

Conference Information
Committee SDM  
Conference Date 2020-11-19 - 2020-11-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process, Device, Circuit simulation, etc. 
Paper Information
Registration To SDM 
Conference Code 2020-11-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A technique for phase-detection auto focus under near-infrared-ray incidence in a back-side illuminated CMOS image sensor pixel 
Sub Title (in English)  
Keyword(1) phase-detection auto focus  
Keyword(2) near infrared ray  
Keyword(3) Ge-on-Si  
Keyword(4) image sensor pixel  
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1st Author's Name Tatsuya Kunikiyo  
1st Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
2nd Author's Name Hidenori Sato  
2nd Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
3rd Author's Name Takeshi Kamino  
3rd Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
4th Author's Name Koji Iizuka  
4th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
5th Author's Name Ken'ichiro Sonoda  
5th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
6th Author's Name Tomohiro Yamashita  
6th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
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Speaker Author-1 
Date Time 2020-11-19 15:20:00 
Presentation Time 60 minutes 
Registration for SDM 
Paper # SDM2020-26 
Volume (vol) vol.120 
Number (no) no.239 
Page pp.21-24 
#Pages 4 
Date of Issue 2020-11-12 (SDM) 

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