Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2021-01-26 15:05
An Implementation of Text-classification Based Fault-prone Module Detection and Its Application to Industrial Environment
Osamu Mizuno, Osamu Mizuno (Kyoto Inst. Tech.), Kazuhiro Ishihara (Valtes), Daisuke Yamashita (Valtes Mobile Tech.) MSS2020-32 SS2020-17
Abstract (in Japanese) (See Japanese page) 
(in English) In the software development, early detection of software defects
(bugs) contributes to mitigate the development effort and improve
the quality of software. For this reason, much research has been
done in the prediction of software defects. We proposed an approach
for defect prediction using the Bayesian classification. In this
study, we implemented a software system of our approach that can be
used in the actual software development.

We have applied our tool in a part of the actual development
project. Based on the feedback from the developers, we confirmed
that our tool can be used in the development.
Keyword (in Japanese) (See Japanese page) 
(in English) Defect prediction / Source code / Text classification / Field study / / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 343, SS2020-17, pp. 19-24, Jan. 2021.
Paper # SS2020-17 
Date of Issue 2021-01-19 (MSS, SS) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MSS2020-32 SS2020-17

Conference Information
Committee MSS SS  
Conference Date 2021-01-26 - 2021-01-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To SS 
Conference Code 2021-01-MSS-SS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An Implementation of Text-classification Based Fault-prone Module Detection and Its Application to Industrial Environment 
Sub Title (in English)  
Keyword(1) Defect prediction  
Keyword(2) Source code  
Keyword(3) Text classification  
Keyword(4) Field study  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Osamu Mizuno  
1st Author's Affiliation Kyoto Institute of Technology (Kyoto Inst. Tech.)
2nd Author's Name Osamu Mizuno  
2nd Author's Affiliation Kyoto Institute of Technology (Kyoto Inst. Tech.)
3rd Author's Name Kazuhiro Ishihara  
3rd Author's Affiliation Valtes Co., Ltd. (Valtes)
4th Author's Name Daisuke Yamashita  
4th Author's Affiliation VALTES Mobile Technology CO.,LTD. (Valtes Mobile Tech.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2021-01-26 15:05:00 
Presentation Time 25 minutes 
Registration for SS 
Paper # MSS2020-32, SS2020-17 
Volume (vol) vol.120 
Number (no) no.342(MSS), no.343(SS) 
Page pp.19-24 
#Pages
Date of Issue 2021-01-19 (MSS, SS) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan