Paper Abstract and Keywords |
Presentation |
2021-02-05 14:25
Fault Coverage Estimation Method in Multi-Cycle Testing Norihiro Nakaoka, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas Electronics Corp.) DC2020-75 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
(Not available yet) |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
/ / / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 120, no. 358, DC2020-75, pp. 36-41, Feb. 2021. |
Paper # |
DC2020-75 |
Date of Issue |
2021-01-29 (DC) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
DC2020-75 |
Conference Information |
Committee |
DC |
Conference Date |
2021-02-05 - 2021-02-05 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Online |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
|
Paper Information |
Registration To |
DC |
Conference Code |
2021-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Fault Coverage Estimation Method in Multi-Cycle Testing |
Sub Title (in English) |
|
Keyword(1) |
|
Keyword(2) |
|
Keyword(3) |
|
Keyword(4) |
|
Keyword(5) |
|
Keyword(6) |
|
Keyword(7) |
|
Keyword(8) |
|
1st Author's Name |
Norihiro Nakaoka |
1st Author's Affiliation |
Ehime University (Ehime Univ.) |
2nd Author's Name |
Senling Wang |
2nd Author's Affiliation |
Ehime University (Ehime Univ.) |
3rd Author's Name |
Yoshinobu Higami |
3rd Author's Affiliation |
Ehime University (Ehime Univ.) |
4th Author's Name |
Hiroshi Takahashi |
4th Author's Affiliation |
Ehime University (Ehime Univ.) |
5th Author's Name |
Hiroyuki Iwata |
5th Author's Affiliation |
Renesas Electronics Corporation (Renesas Electronics Corp.) |
6th Author's Name |
Yoichi Maeda |
6th Author's Affiliation |
Renesas Electronics Corporation (Renesas Electronics Corp.) |
7th Author's Name |
Jun Matsushima |
7th Author's Affiliation |
Renesas Electronics Corporation (Renesas Electronics Corp.) |
8th Author's Name |
|
8th Author's Affiliation |
() |
9th Author's Name |
|
9th Author's Affiliation |
() |
10th Author's Name |
|
10th Author's Affiliation |
() |
11th Author's Name |
|
11th Author's Affiliation |
() |
12th Author's Name |
|
12th Author's Affiliation |
() |
13th Author's Name |
|
13th Author's Affiliation |
() |
14th Author's Name |
|
14th Author's Affiliation |
() |
15th Author's Name |
|
15th Author's Affiliation |
() |
16th Author's Name |
|
16th Author's Affiliation |
() |
17th Author's Name |
|
17th Author's Affiliation |
() |
18th Author's Name |
|
18th Author's Affiliation |
() |
19th Author's Name |
|
19th Author's Affiliation |
() |
20th Author's Name |
|
20th Author's Affiliation |
() |
Speaker |
Author-1 |
Date Time |
2021-02-05 14:25:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2020-75 |
Volume (vol) |
vol.120 |
Number (no) |
no.358 |
Page |
pp.36-41 |
#Pages |
6 |
Date of Issue |
2021-01-29 (DC) |
|