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Paper Abstract and Keywords
Presentation 2021-02-05 15:30
A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level
Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2020-77
Abstract (in Japanese) (See Japanese page) 
(in English) A field testing that monitors the values of circuit outputs and internal signal lines during function mode is used as one of the means to avoid failures due to aging of VLSIs. Especially, VLSIs on automobiles needs to be tested in a short time when the engines are started, using built-in self-test. In built-in self-test, scan design which can obtain high fault coverage is generally used. However, there are problems such as large area overhead and long test execution time compared to non-scan design. In non-scan design-based field testing, a status signal sequence generation method to execute each state transition of the controller at least n times was proposed. In this paper, we propose a don't care filling method for control signals to increase fault coverage in field testing. In the proposed method, a structural symbolic simulation is performed with status signal sequences for n state transition cover, hardware elements which have not been tested are identified, and logic values are assigned to don't cares in control signals to test the hardware elements.
Keyword (in Japanese) (See Japanese page) 
(in English) field testing / non-scan design / structural symbolic simulation / control signals / don’t care filling / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 358, DC2020-77, pp. 48-53, Feb. 2021.
Paper # DC2020-77 
Date of Issue 2021-01-29 (DC) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2021-02-05 - 2021-02-05 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2021-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level 
Sub Title (in English)  
Keyword(1) field testing  
Keyword(2) non-scan design  
Keyword(3) structural symbolic simulation  
Keyword(4) control signals  
Keyword(5) don’t care filling  
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1st Author's Name Yuki Ikegaya  
1st Author's Affiliation Nihon University (Nihon Univ.)
2nd Author's Name Yuta Ishiyama  
2nd Author's Affiliation Nihon University (Nihon Univ.)
3rd Author's Name Toshinori Hosokawa  
3rd Author's Affiliation Nihon University (Nihon Univ.)
4th Author's Name Masayoshi Yoshimura  
4th Author's Affiliation Kyoto Sangyo University (Kyoto Sangyo Univ.)
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Speaker Author-1 
Date Time 2021-02-05 15:30:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2020-77 
Volume (vol) vol.120 
Number (no) no.358 
Page pp.48-53 
#Pages 6 
Date of Issue 2021-01-29 (DC) 

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