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Paper Abstract and Keywords
Presentation 2021-03-03 13:50
Analysis of the Impact of Automatically Generated Test Cases on the Results of Automatic Bug Repair
Yuga Matsuda, Kyosuke Yamate, Yasutaka Kamei, Naoyasu Ubayashi (Kyushu Univ.) SS2020-32
Abstract (in Japanese) (See Japanese page) 
(in English) In order to reduce debugging costs in software development, there has been a lot of research on automatic program repair. Test suite based automatic program repair, which has been widely studied, depends on the quality of test cases, but it costs a lot of money to create good quality test cases. Recently, in order to reduce the cost of the testing process, research on automatic test case generation has been conducted. We thought that we could reduce the cost of test case creation by using automatically generated test cases for automatic program repair. In this study, we investigated the effect of automatically generated test cases on the results of automatic program repair, based on the success rate of patch generation. As a result of experiments on actual bugs in OSS projects, it was found that patches were generated for 23 bugs using the automatically generated test cases and for 13 bugs using the manually generated test cases. Only 3 bugs generated patches in common, and the bugs that actually generated patches were different. We also found that the success rate of patch generation differs depending on the coverage, which is the criterion for automatic test case generation.
Keyword (in Japanese) (See Japanese page) 
(in English) Automatic program repair / Automatic test case generation / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 407, SS2020-32, pp. 25-30, March 2021.
Paper # SS2020-32 
Date of Issue 2021-02-24 (SS) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Notes on Review This article is a technical report without peer review, and its polished version will be published elsewhere.
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Conference Information
Committee SS  
Conference Date 2021-03-03 - 2021-03-04 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To SS 
Conference Code 2021-03-SS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Analysis of the Impact of Automatically Generated Test Cases on the Results of Automatic Bug Repair 
Sub Title (in English)  
Keyword(1) Automatic program repair  
Keyword(2) Automatic test case generation  
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1st Author's Name Yuga Matsuda  
1st Author's Affiliation Kyushu University (Kyushu Univ.)
2nd Author's Name Kyosuke Yamate  
2nd Author's Affiliation Kyushu University (Kyushu Univ.)
3rd Author's Name Yasutaka Kamei  
3rd Author's Affiliation Kyushu University (Kyushu Univ.)
4th Author's Name Naoyasu Ubayashi  
4th Author's Affiliation Kyushu University (Kyushu Univ.)
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Speaker Author-1 
Date Time 2021-03-03 13:50:00 
Presentation Time 25 minutes 
Registration for SS 
Paper # SS2020-32 
Volume (vol) vol.120 
Number (no) no.407 
Page pp.25-30 
#Pages
Date of Issue 2021-02-24 (SS) 


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