Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2021-03-05 11:30
A simple degree inspection method of color weakness using confused lines
Mamoru Kawai, Mitsuhiko Meguro, Masakazu Furuichi (Nihon Univ.) SIS2020-58
Abstract (in Japanese) (See Japanese page) 
(in English) In this paper, we propose a creating method for an inspection plate that easily measures a degree of color weakness. The Ishihara test plate is well known as the inspection method the presence or absence of color blindness. However, the method cannot measure the degree of color weakness. Instead, the anomaloscope can measure the type of color blindness and the degree of color weakness. However, in order to be diagnosed with the anomaloscope, you must go to an ophthalmologist who is familiar with its usage. The proposed method does not require the inspection by an ophthalmologist, and the degree of color weakness can be examined simply by looking at the inspection plate. Through experiments, we clarify the effectiveness of the proposed method.
Keyword (in Japanese) (See Japanese page) 
(in English) color blindness / color anomaly / color difference / confused line / color weakness inspection plate / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 415, SIS2020-58, pp. 126-131, March 2021.
Paper # SIS2020-58 
Date of Issue 2021-02-25 (SIS) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SIS2020-58

Conference Information
Committee SIS  
Conference Date 2021-03-04 - 2021-03-05 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Soft Computing, etc. 
Paper Information
Registration To SIS 
Conference Code 2021-03-SIS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A simple degree inspection method of color weakness using confused lines 
Sub Title (in English)  
Keyword(1) color blindness  
Keyword(2) color anomaly  
Keyword(3) color difference  
Keyword(4) confused line  
Keyword(5) color weakness inspection plate  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Mamoru Kawai  
1st Author's Affiliation Nihon University (Nihon Univ.)
2nd Author's Name Mitsuhiko Meguro  
2nd Author's Affiliation Nihon University (Nihon Univ.)
3rd Author's Name Masakazu Furuichi  
3rd Author's Affiliation Nihon University (Nihon Univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2021-03-05 11:30:00 
Presentation Time 20 minutes 
Registration for SIS 
Paper # SIS2020-58 
Volume (vol) vol.120 
Number (no) no.415 
Page pp.126-131 
#Pages 6 
Date of Issue 2021-02-25 (SIS) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan