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Paper Abstract and Keywords
Presentation 2021-03-05 13:35
A Study of noise source identification method based on near-field measurement of switching power supplies
Hiroyasu Sano, Satoshi Suzuki, Yasuaki Kaneda, Hidekatsu Sasaki (TIRI), Kenta Umebayashi (TAT) EMCJ2020-78
Abstract (in Japanese) (See Japanese page) 
(in English) Fast switching increases the radiated noise, which is a problem that exceeds the regulation value of radiated emission test. In particular, when multiple switching power supplies are mixed, it has been difficult to identify the source of the noise because the noise overlaps in the same frequency band. In this study, we propose a method to estimate the far-field measurement waveform of each switching power supply module by identifying the noise source based on the periodicity of the pulses in the near field. In this paper, we propose a method to estimate the far-field measurement waveform of each switching power supply.
Keyword (in Japanese) (See Japanese page) 
(in English) EMI / source identification / far field / near field / / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 420, EMCJ2020-78, pp. 30-34, March 2021.
Paper # EMCJ2020-78 
Date of Issue 2021-02-26 (EMCJ) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ MICT  
Conference Date 2021-03-05 - 2021-03-05 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2021-03-EMCJ-MICT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study of noise source identification method based on near-field measurement of switching power supplies 
Sub Title (in English)  
Keyword(1) EMI  
Keyword(2) source identification  
Keyword(3) far field  
Keyword(4) near field  
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1st Author's Name Hiroyasu Sano  
1st Author's Affiliation Tokyo Metropolitan Industrial Technology Research Institute (TIRI)
2nd Author's Name Satoshi Suzuki  
2nd Author's Affiliation Tokyo Metropolitan Industrial Technology Research Institute (TIRI)
3rd Author's Name Yasuaki Kaneda  
3rd Author's Affiliation Tokyo Metropolitan Industrial Technology Research Institute (TIRI)
4th Author's Name Hidekatsu Sasaki  
4th Author's Affiliation Tokyo Metropolitan Industrial Technology Research Institute (TIRI)
5th Author's Name Kenta Umebayashi  
5th Author's Affiliation Tokyo University of Agriculture and Technology (TAT)
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Speaker Author-1 
Date Time 2021-03-05 13:35:00 
Presentation Time 20 minutes 
Registration for EMCJ 
Paper # EMCJ2020-78 
Volume (vol) vol.120 
Number (no) no.420 
Page pp.30-34 
#Pages 5 
Date of Issue 2021-02-26 (EMCJ) 

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