IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2021-10-19 10:50
Study on Fault Injection into Cryptographic Modules Using Continuous Sinusoidal Waves with Controlled Frequency, Amplitude and Phase
Hikaru Nishiyama, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) HWS2021-43 ICD2021-17
Abstract (in Japanese) (See Japanese page) 
(in English) A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave can generate a fault that can be used for the differential fault analysis (DFA) without modifying and tampering with the cryptographic device. However, in this attack, multi-byte faults in the output ciphertext which are not suitable for the DFA are generated frequently, and they increase the analysis time dramatically. In this paper, we propose a method that can increase the occurrence of a 1-byte fault in the output ciphertext by controlling the frequency, phase, and amplitude of the injected sinusoidal wave. Specifically, we control the frequency and phase of the sinusoidal wave injected into the cryptographic module implemented with the advanced encryption standard (AES). At the same time, the error rate of the output ciphertext is monitored so that a glitch is generated on the rising clock-edge with the same phase. At this condition, the amplitude is controlled to further increase the timing difference between the rising timing of the original clock and the overclocking occurrence timing associated with the glitch. It is experimentally validated that the proposed method can increase the occurrence of the 1-byte fault and it is capable of controlling the number of fault bytes in the output ciphertext.
Keyword (in Japanese) (See Japanese page) 
(in English) Fault Injection Attack / Intentional Electromagnetic Interference / Differential Fault Analysis / / / / /  
Reference Info. IEICE Tech. Rep., vol. 121, no. 206, HWS2021-43, pp. 13-18, Oct. 2021.
Paper # HWS2021-43 
Date of Issue 2021-10-12 (HWS, ICD) 
ISSN Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF HWS2021-43 ICD2021-17

Conference Information
Committee HWS ICD  
Conference Date 2021-10-19 - 2021-10-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Hardware Security, etc. 
Paper Information
Registration To HWS 
Conference Code 2021-10-HWS-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Study on Fault Injection into Cryptographic Modules Using Continuous Sinusoidal Waves with Controlled Frequency, Amplitude and Phase 
Sub Title (in English)  
Keyword(1) Fault Injection Attack  
Keyword(2) Intentional Electromagnetic Interference  
Keyword(3) Differential Fault Analysis  
1st Author's Name Hikaru Nishiyama  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Daisuke Fujimoto  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Youngwoo Kim  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Yuichi Hayashi  
4th Author's Affiliation Nara Institute of Science and Technology (NAIST)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2021-10-19 10:50:00 
Presentation Time 25 minutes 
Registration for HWS 
Paper # HWS2021-43, ICD2021-17 
Volume (vol) vol.121 
Number (no) no.206(HWS), no.207(ICD) 
Page pp.13-18 
Date of Issue 2021-10-12 (HWS, ICD) 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan