講演抄録/キーワード |
講演名 |
2021-11-11 14:30
Theoretical and Experimental Analysis of Terahertz Scattering from Rough Surfaces ○Suyun Wang・Takayoshi Yamada(NICT)・Kun-Shan Chen(Guilin University of Technology)・Yasuko Kasai(NICT) SANE2021-38 |
抄録 |
(和) |
In this paper, we explore the terahertz scattering from statistically-specified randomly rough surfaces at 480 GHz. These contain eight reference surfaces made from Durable Resin V2 by 3D printing with the prescribed power spectral density and height probability density function, along with the RMS heights and correlation lengths. The dielectric constant of the material was measured by terahertz time-domain spectroscopy (THz-TDS). To better understand the physical mechanism of the terahertz scattering from random rough surfaces, the effects of root-mean-square (RMS) height, correlation length, dielectric constant, and probing frequency, polarization, and incidence angle were investigated. We applied the well-known advanced integral equation model (AIEM) to calculate HH- and VV-polarized scattering coefficients, both coherent and incoherent. Numerical results indicate that the diffuse scattering is enhanced when the RMS height increases, particularly in backscattering. As the correlation length varies, the scattering patterns illustrate a strong azimuthal dependence. We conducted measurements to measure the given rough surfaces by Picometrix T-Ray 4000. The measured results show that, at terahertz region, the reflectivity decreases as the surface roughness increases. Hence it is practically feasible to remote sensing of the rough surface by terahertz scattering. |
(英) |
In this paper, we explore the terahertz scattering from statistically-specified randomly rough surfaces at 480 GHz. These contain eight reference surfaces made from Durable Resin V2 by 3D printing with the prescribed power spectral density and height probability density function, along with the RMS heights and correlation lengths. The dielectric constant of the material was measured by terahertz time-domain spectroscopy (THz-TDS). To better understand the physical mechanism of the terahertz scattering from random rough surfaces, the effects of root-mean-square (RMS) height, correlation length, dielectric constant, and probing frequency, polarization, and incidence angle were investigated. We applied the well-known advanced integral equation model (AIEM) to calculate HH- and VV-polarized scattering coefficients, both coherent and incoherent. Numerical results indicate that the diffuse scattering is enhanced when the RMS height increases, particularly in backscattering. As the correlation length varies, the scattering patterns illustrate a strong azimuthal dependence. We conducted measurements to measure the given rough surfaces by Picometrix T-Ray 4000. The measured results show that, at terahertz region, the reflectivity decreases as the surface roughness increases. Hence it is practically feasible to remote sensing of the rough surface by terahertz scattering. |
キーワード |
(和) |
Terahertz Scattering / Rough Surface / THz-TDS / T-Ray / / / / |
(英) |
Terahertz Scattering / Rough Surface / THz-TDS / T-Ray / / / / |
文献情報 |
信学技報, vol. 121, no. 236, SANE2021-38, pp. 36-39, 2021年11月. |
資料番号 |
SANE2021-38 |
発行日 |
2021-11-04 (SANE) |
ISSN |
Online edition: ISSN 2432-6380 |
著作権に ついて |
技術研究報告に掲載された論文の著作権は電子情報通信学会に帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
PDFダウンロード |
SANE2021-38 |
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