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Paper Abstract and Keywords
Presentation 2021-12-01 14:45
Diagnosis of Switching-Induced IR Drop by On-Chip Voltage Monitors
Kazuki (Kobe Univ.), Leonidas Kataselas (Aristotle Univ.), Ferenc Fodor (IMEC), Alkis Hatzopoulos (Aristotle Univ.), Makoto Nagata (Kobe Univ.), Erik Jan Marinissen (IMEC) VLD2021-31 ICD2021-41 DC2021-37 RECONF2021-39
Abstract (in Japanese) (See Japanese page) 
(in English) On-chip monitor (OCM) circuits enable us to observe dynamic power-supply (PS) waveforms within power domains individually partitioned by dedicated micro voltage regulator modules (μVRMs). In this paper, OCM is used to diagnose VLSI circuits with a modular power management and the combinational logics are precisely captured in the OCM voltage waveforms. A mismatch between simulation and measurement warns us of either (1) malfunction in the hardware module, or (2) defects in the test program. In this paper, we demonstrate an IR-drop-based toggle diagnosis technique using OCM for a prototype chip in 180 nm CMOS technology.
Keyword (in Japanese) (See Japanese page) 
(in English) Power Noise / background diagnosis / on-chip monitoring / VLSI circuits / / / /  
Reference Info. IEICE Tech. Rep., vol. 121, no. 278, ICD2021-41, pp. 83-86, Dec. 2021.
Paper # ICD2021-41 
Date of Issue 2021-11-24 (VLD, ICD, DC, RECONF) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2021-31 ICD2021-41 DC2021-37 RECONF2021-39

Conference Information
Committee VLD DC RECONF ICD IPSJ-SLDM  
Conference Date 2021-12-01 - 2021-12-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2021 -New Field of VLSI Design- 
Paper Information
Registration To ICD 
Conference Code 2021-12-VLD-DC-RECONF-ICD-SLDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Diagnosis of Switching-Induced IR Drop by On-Chip Voltage Monitors 
Sub Title (in English)  
Keyword(1) Power Noise  
Keyword(2) background diagnosis  
Keyword(3) on-chip monitoring  
Keyword(4) VLSI circuits  
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1st Author's Name Kazuki  
1st Author's Affiliation Monta (Kobe Univ.)
2nd Author's Name Leonidas Kataselas  
2nd Author's Affiliation Aristotle University (Aristotle Univ.)
3rd Author's Name Ferenc Fodor  
3rd Author's Affiliation IMEC (IMEC)
4th Author's Name Alkis Hatzopoulos  
4th Author's Affiliation Aristotle University (Aristotle Univ.)
5th Author's Name Makoto Nagata  
5th Author's Affiliation Monta (Kobe Univ.)
6th Author's Name Erik Jan Marinissen  
6th Author's Affiliation IMEC (IMEC)
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Speaker Author-1 
Date Time 2021-12-01 14:45:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # VLD2021-31, ICD2021-41, DC2021-37, RECONF2021-39 
Volume (vol) vol.121 
Number (no) no.277(VLD), no.278(ICD), no.279(DC), no.280(RECONF) 
Page pp.83-86 
#Pages 4 
Date of Issue 2021-11-24 (VLD, ICD, DC, RECONF) 

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