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Paper Abstract and Keywords
Presentation 2022-01-28 10:10
Numerical Analysis of Contact Impedance During Contact Current Exposure at Intermediate Frequencies
Yuto Nishikawa, Jose David Gomez Tames (NITech), Yoshitsugu Kamimura (Utsunomiya Univ.), Shintaro Uehara, Youhei Odaka (Fujita Health Univ.), Akimasa Hirata (NITech) EST2021-81
Abstract (in Japanese) (See Japanese page) 
(in English) International Commission on Non-Ionizing Radiation Protection (ICNIRP) guidelines and IEEE standards set protection limits to electromagnetic exposure including contact currents. Contact current is an indirect exposure in which current flows through a person touching an object that is within an electric or magnetic field. However, establishing protection limits of contact current is difficult due to different factors, such as grasping conditions, contact area, and resistance between conducting object and contacting tissue. Also, it has been pointed out that the basic restriction may be exceeded for exposure at the reference level. In consequence, ICNIRP guidelines have been revised in 2020 and no longer provides contact current reference level, and instead use a new category called “guidance”. Therefore, it becomes necessary to clarify the effects of different factors during contact current exposure. The present study investigates hand impedance by finite-difference time-domain (FDTD) method for correct computational modeling of contact current. Then, the dependence of contact impedance on the contact area is studied by the FDTD method. As a result, it was found that the impedance became smaller when the contact area was increased.
Keyword (in Japanese) (See Japanese page) 
(in English) Contact current / FDTD method / Contact area, Impedance / / / / /  
Reference Info. IEICE Tech. Rep., vol. 121, no. 358, EST2021-81, pp. 122-125, Jan. 2022.
Paper # EST2021-81 
Date of Issue 2022-01-20 (EST) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EST  
Conference Date 2022-01-27 - 2022-01-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Simulation techniques, etc. 
Paper Information
Registration To EST 
Conference Code 2022-01-EST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Numerical Analysis of Contact Impedance During Contact Current Exposure at Intermediate Frequencies 
Sub Title (in English)  
Keyword(1) Contact current  
Keyword(2) FDTD method  
Keyword(3) Contact area, Impedance  
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1st Author's Name Yuto Nishikawa  
1st Author's Affiliation Nagoya Institute of Technology (NITech)
2nd Author's Name Jose David Gomez Tames  
2nd Author's Affiliation Nagoya Institute of Technology (NITech)
3rd Author's Name Yoshitsugu Kamimura  
3rd Author's Affiliation Utsunomiya University (Utsunomiya Univ.)
4th Author's Name Shintaro Uehara  
4th Author's Affiliation Fujita Health University (Fujita Health Univ.)
5th Author's Name Youhei Odaka  
5th Author's Affiliation Fujita Health University (Fujita Health Univ.)
6th Author's Name Akimasa Hirata  
6th Author's Affiliation Nagoya Institute of Technology (NITech)
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Speaker Author-1 
Date Time 2022-01-28 10:10:00 
Presentation Time 20 minutes 
Registration for EST 
Paper # EST2021-81 
Volume (vol) vol.121 
Number (no) no.358 
Page pp.122-125 
#Pages 4 
Date of Issue 2022-01-20 (EST) 

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