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Paper Abstract and Keywords
Presentation 2022-04-23 10:45
Direct Observation and Evaluation of In-gap States of Inorganic and Organic Semiconductors via High-sensitivity UV Photoelectron Spectroscopy
Ryotaro Nakazawa, Kenta Watanabe, Yuya Tanaka, Hisao Ishii (Chiba Univ.) SDM2022-11 OME2022-11
Abstract (in Japanese) (See Japanese page) 
(in English) The properties of devices based on inorganic and organic semiconductors are often greatly affected by in-gap states that are located in the forbidden band gap, and a method to accurately determine the density of states (DOS) of them are required. Therefore, we have developed highly sensitive ultraviolet photoelectron spectroscopy method (HS-UPS), in which UPS measurement are repeatedly performed by changing wavelength of an incident light. Combined with constant final state yield spectroscopy method (CFS-YS), which measures the yield of photoelectrons with constant kinetic energy while changing the wavelength of the incident light, it is possible to directly determine DOS of in the gap states down to around the Fermi energy. In my talk, I will discuss applications and usefulness of HS-UPS to organic and inorganic semiconductors.
Keyword (in Japanese) (See Japanese page) 
(in English) High Sensitivity Ultraviolet Photoemission Spectroscopy / In-Gap States / Organic Semiconductor / Inorganic semiconductor / / / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 9, OME2022-11, pp. 51-56, April 2022.
Paper # OME2022-11 
Date of Issue 2022-04-15 (SDM, OME) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2022-11 OME2022-11

Conference Information
Committee OME SDM  
Conference Date 2022-04-22 - 2022-04-23 
Place (in Japanese) (See Japanese page) 
Place (in English) Takachiho Hall 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Thin film devices (Si, compound, organic, flexible), Biotechnology, Materials, Characterization, etc. 
Paper Information
Registration To OME 
Conference Code 2022-04-OME-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Direct Observation and Evaluation of In-gap States of Inorganic and Organic Semiconductors via High-sensitivity UV Photoelectron Spectroscopy 
Sub Title (in English)  
Keyword(1) High Sensitivity Ultraviolet Photoemission Spectroscopy  
Keyword(2) In-Gap States  
Keyword(3) Organic Semiconductor  
Keyword(4) Inorganic semiconductor  
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1st Author's Name Ryotaro Nakazawa  
1st Author's Affiliation Chiba University (Chiba Univ.)
2nd Author's Name Kenta Watanabe  
2nd Author's Affiliation Chiba University (Chiba Univ.)
3rd Author's Name Yuya Tanaka  
3rd Author's Affiliation Chiba University (Chiba Univ.)
4th Author's Name Hisao Ishii  
4th Author's Affiliation Chiba University (Chiba Univ.)
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Speaker Author-1 
Date Time 2022-04-23 10:45:00 
Presentation Time 25 minutes 
Registration for OME 
Paper # SDM2022-11, OME2022-11 
Volume (vol) vol.122 
Number (no) no.8(SDM), no.9(OME) 
Page pp.51-56 
#Pages 6 
Date of Issue 2022-04-15 (SDM, OME) 

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