Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2022-07-29 10:55
Nanoparticle Measurements by Focused-Beam Dynamic Ultrasound Scattering Method
Kana Kitao, Tomohisa Norisuye (KIT) US2022-20
Abstract (in Japanese) (See Japanese page) 
(in English) When megahertz ultrasound is incident on nanoparticles, scattering occurs, but the intensity is quite small. This problem can be solved by increasing the ultrasonic energy, but this results in acoustic streaming that inhibits particle motion. Therefore, in this study, by reducing the cell thickness from the conventional 10 mm to several hundred µm, a highly accurate dynamic nanoparticle measurement was achieved while using a powerful focus sensor. As a result, analysis of silica particles with a diameter of 30 nm became possible. Micron particle size analysis was further conducted to evaluate a wide range of particle size distributions over three orders of magnitude from 30 nm to 10 µm in diameter and compared the results with those of electron microscopy.
Keyword (in Japanese) (See Japanese page) 
(in English) Ultrasound / Scattering / Microsphere / / / / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 141, US2022-20, pp. 5-7, July 2022.
Paper # US2022-20 
Date of Issue 2022-07-22 (US) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF US2022-20

Conference Information
Committee US  
Conference Date 2022-07-29 - 2022-07-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyushu Univ. (Chikushi Campus) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Material characterization, Ultrasonics, etc. 
Paper Information
Registration To US 
Conference Code 2022-07-US 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Nanoparticle Measurements by Focused-Beam Dynamic Ultrasound Scattering Method 
Sub Title (in English)  
Keyword(1) Ultrasound  
Keyword(2) Scattering  
Keyword(3) Microsphere  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kana Kitao  
1st Author's Affiliation Kyoto Institute of Technology (KIT)
2nd Author's Name Tomohisa Norisuye  
2nd Author's Affiliation Kyoto Institute of Technology (KIT)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2022-07-29 10:55:00 
Presentation Time 25 minutes 
Registration for US 
Paper # US2022-20 
Volume (vol) vol.122 
Number (no) no.141 
Page pp.5-7 
#Pages
Date of Issue 2022-07-22 (US) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan