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Paper Abstract and Keywords
Presentation 2022-10-25 11:50
Optical Microscopic Observation of Semiconductor Devices toward Hardware Trojan Detection
Hirofumi Sakane, Junichi Sakamoto, Shinichi Kawamura (AIST), Makoto Nagata (Kobe Univ.), Yuichi Hayashi (NAIST) HWS2022-34 ICD2022-26
Abstract (in Japanese) (See Japanese page) 
(in English) In this paper we focus on detection of hardware Trojan (HT) in semiconductor devices under a scenario with following steps: first, a device vendor designs a semiconductor device, next, the vendor asks its manufacturing to an offshore fabrication, then, the vendor verifies if the device is infected by HT or not. In this scenario, we assume that the vendor owns the original design data as the golden data, and he can possibly find HT by comparing the golden data and the manufactured device. If the device is successfully reverse engineered, most HTs can be detected theoretically. In reality, the cost and accuracy of reverse engineering become vital issues as the circuit size increases, and this approach may be unrealistic. In this paper, instead of aiming at 100% successful detection, we rather aim at making it clear what kind of HT can be detected with a moderate cost. Our first report here is showing the result of optical microscopic observation of semiconductor devices.
Keyword (in Japanese) (See Japanese page) 
(in English) Hardware Trojan / Semiconductor Chip / Optical microscope / Visible light / Near infrared light / / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 227, HWS2022-34, pp. 23-28, Oct. 2022.
Paper # HWS2022-34 
Date of Issue 2022-10-18 (HWS, ICD) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF HWS2022-34 ICD2022-26

Conference Information
Committee HWS ICD  
Conference Date 2022-10-25 - 2022-10-25 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Hardware Security, etc. 
Paper Information
Registration To HWS 
Conference Code 2022-10-HWS-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Optical Microscopic Observation of Semiconductor Devices toward Hardware Trojan Detection 
Sub Title (in English)  
Keyword(1) Hardware Trojan  
Keyword(2) Semiconductor Chip  
Keyword(3) Optical microscope  
Keyword(4) Visible light  
Keyword(5) Near infrared light  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Hirofumi Sakane  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Junichi Sakamoto  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Shinichi Kawamura  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Makoto Nagata  
4th Author's Affiliation Kobe University (Kobe Univ.)
5th Author's Name Yuichi Hayashi  
5th Author's Affiliation NARA Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2022-10-25 11:50:00 
Presentation Time 25 minutes 
Registration for HWS 
Paper # HWS2022-34, ICD2022-26 
Volume (vol) vol.122 
Number (no) no.227(HWS), no.228(ICD) 
Page pp.23-28 
#Pages 6 
Date of Issue 2022-10-18 (HWS, ICD) 

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