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Paper Abstract and Keywords
Presentation 2022-11-10 14:00
[Invited Talk] Modeling Electrical Properties of CrSi Thin Films
Kenichiro Sonoda, Nobuhito Shiraishi, Kazuyoshi Maekawa, Nozomi Ito, Eiji Hasegawa, Tamotsu Ogata (Renesas Electronics) SDM2022-67
Abstract (in Japanese) (See Japanese page) 
(in English) Electrical resistivity of CrSi thin films is modeled considering phase transitions and grain growth during thermal annealing. The effective medium approximation is used to calculate the electrical resistivity of the thin film which comprises several materials and phases including grain boundaries. The phase transition from as-deposited amorphous to poly-crystalline including a meta-stable state leads to high resistivity within a certain range of annealing temperature.
Keyword (in Japanese) (See Japanese page) 
(in English) thin film resistor / chromium silicon / phase transition / grain growth / modeling / simulation / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 247, SDM2022-67, pp. 14-18, Nov. 2022.
Paper # SDM2022-67 
Date of Issue 2022-11-03 (SDM) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee SDM  
Conference Date 2022-11-10 - 2022-11-11 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process, Device, Circuit simulation, etc. 
Paper Information
Registration To SDM 
Conference Code 2022-11-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Modeling Electrical Properties of CrSi Thin Films 
Sub Title (in English)  
Keyword(1) thin film resistor  
Keyword(2) chromium silicon  
Keyword(3) phase transition  
Keyword(4) grain growth  
Keyword(5) modeling  
Keyword(6) simulation  
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Keyword(8)  
1st Author's Name Kenichiro Sonoda  
1st Author's Affiliation Renesas Electronics (Renesas Electronics)
2nd Author's Name Nobuhito Shiraishi  
2nd Author's Affiliation Renesas Electronics (Renesas Electronics)
3rd Author's Name Kazuyoshi Maekawa  
3rd Author's Affiliation Renesas Electronics (Renesas Electronics)
4th Author's Name Nozomi Ito  
4th Author's Affiliation Renesas Electronics (Renesas Electronics)
5th Author's Name Eiji Hasegawa  
5th Author's Affiliation Renesas Electronics (Renesas Electronics)
6th Author's Name Tamotsu Ogata  
6th Author's Affiliation Renesas Electronics (Renesas Electronics)
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Speaker Author-1 
Date Time 2022-11-10 14:00:00 
Presentation Time 60 minutes 
Registration for SDM 
Paper # SDM2022-67 
Volume (vol) vol.122 
Number (no) no.247 
Page pp.14-18 
#Pages
Date of Issue 2022-11-03 (SDM) 


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