Paper Abstract and Keywords |
Presentation |
2022-12-08 17:45
Optimal Measurement Configurations for Sequential Quantum Optimization of Variational Quantum Eigensolver Katsuhiro Endo (AIST/Keio Univ.), Hiroshi Watanabe (Keio Univ.), Yuki Sato (Toyota Central R&D Labs., Inc./Keio Univ.), Rudy Raymond (IBM Japan,Ltd./Keio Univ./The Univ. of Tokyo), Naoki Yamamoto, Mayu Muramatsu (Keio Univ.) |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Variational Quantum Eigenvalue solver (VQE) is a hybrid algorithm that optimizes a quantum state represented by a parametrized quantum circuit using a classical computer. As one of the optimization methods for VQE, a sequential optimization method was recently proposed, in which analytical optimal solutions are sequentially and repeatedly obtained for each single-qubit gate. This method use an important advantage that an exact analytical solution of one target parameterized gate can be obtained by expectation value measurement with a constant number of predetermined parameter configurations. In this study, we show that there is a high arbitrariness in the choice of these parameter configurations and that the estimation accuracy depends on the choice of the gates configurations, taking into account the effect of measurement shot noise due to the approximation of the expectation measurement with a finite number of measurements. We also proposed a score (E-Score) to quantitatively pre-evaluate the accuracy of the solution estimation, and showed the specific parameter configurations with the best scores for all parameter gate models. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Variational Quantum Eigensolver (VQE) / Optimal Measurement Configurations / Expectation value measurement / / / / / |
Reference Info. |
IEICE Tech. Rep. |
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