IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2022-12-15 15:45
The trends of IEC/TC 56 Dependability
Ko Kawashima (ORIENTAL MOTOR), Yoshinobu Sato (Institute for Healthcare Quality Improvement), Yoshiki Kinoshita (Kanagawa Univ.), Hiroyuki Goto (D.SS), Akihiko Masuda (Reliability Seven Tools (R7) Practice Studio), Shigeru Yanagi (National Defense Academy), Makoto Takeyama (Kanagawa Univ.), Tadahiro Shibutani (Yokohama National Univ.) R2022-47
Abstract (in Japanese) (See Japanese page) 
(in English) IEC/TC 56 is in charge of developing and revising international dependability standards related horizontally to both of IEC and ISO. Recently it has turned into including the categories of risk assessment techniques. The present report describes the trend of TC 56 with respect to Japanese National Committee of Dependability, and the situations of their developments as well as revisions of standards, etc., concerning WG 1 for concepts / definitions of dependability terms, WG 2 for analytic / testing techniques of dependability, WG 3 for dependability management and WG 4 for software / systems aspects of dependability, for recent three years.
Keyword (in Japanese) (See Japanese page) 
(in English) IEC/TC 56 / dependability / open system / / / / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 315, R2022-47, pp. 19-24, Dec. 2022.
Paper # R2022-47 
Date of Issue 2022-12-08 (R) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2022-47

Conference Information
Committee R  
Conference Date 2022-12-15 - 2022-12-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability International Standard, Maintainability, Reliability General, Safety General 
Paper Information
Registration To R 
Conference Code 2022-12-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) The trends of IEC/TC 56 Dependability 
Sub Title (in English)  
Keyword(1) IEC/TC 56  
Keyword(2) dependability  
Keyword(3) open system  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Ko Kawashima  
1st Author's Affiliation ORIENTAL MOTOR CO., LTD. (ORIENTAL MOTOR)
2nd Author's Name Yoshinobu Sato  
2nd Author's Affiliation Institute of Healthcare Quality Improvement, Tokyo Healthcare Foundation (Institute for Healthcare Quality Improvement)
3rd Author's Name Yoshiki Kinoshita  
3rd Author's Affiliation Kanagawa University (Kanagawa Univ.)
4th Author's Name Hiroyuki Goto  
4th Author's Affiliation D.SS (D.SS)
5th Author's Name Akihiko Masuda  
5th Author's Affiliation Reliability Seven Tools (R7) Practice Studio (Reliability Seven Tools (R7) Practice Studio)
6th Author's Name Shigeru Yanagi  
6th Author's Affiliation National Defense Academy (National Defense Academy)
7th Author's Name Makoto Takeyama  
7th Author's Affiliation Kanagawa University (Kanagawa Univ.)
8th Author's Name Tadahiro Shibutani  
8th Author's Affiliation Yokohama National University (Yokohama National Univ.)
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2022-12-15 15:45:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2022-47 
Volume (vol) vol.122 
Number (no) no.315 
Page pp.19-24 
#Pages
Date of Issue 2022-12-08 (R) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan