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Paper Abstract and Keywords
Presentation 2023-01-19 13:15
[Invited Talk] Whole element loss analysis by Scideam -- Proposal to realize the front loading --
Soichiro Nakamura, Masatoshi Nakahara (SEL) EE2022-36
Abstract (in Japanese) (See Japanese page) 
(in English) Conventionally, in order to perform loss analysis, loss is often calculated using theoretical formulas and approximation formulas, or Spice models provided by semiconductor manufacturers and others are often used. This is very time consuming and labor intensive, and is generally carried out after the design process is almost complete.

For this reason, design development is often based on empirical values, and challenging development requires a great deal of time by skilled engineers.
The newly developed Scideam loss analysis option uses a unique switching element model to achieve high-speed analysis, and the loss measurement function for all elements enables overwhelming efficiency improvements, which was difficult in the past. In addition, it has become possible to build a front-loading environment for loss analysis.

We will propose the method while comparing with the actual machine.
Keyword (in Japanese) (See Japanese page) 
(in English) Scideam / Loss Analysis / Soft Switching / Development Method / Front Loading / / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 343, EE2022-36, pp. 33-58, Jan. 2023.
Paper # EE2022-36 
Date of Issue 2023-01-12 (EE) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EE2022-36

Conference Information
Committee EE  
Conference Date 2023-01-19 - 2023-01-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyushu Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EE 
Conference Code 2023-01-EE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Whole element loss analysis by Scideam 
Sub Title (in English) Proposal to realize the front loading 
Keyword(1) Scideam  
Keyword(2) Loss Analysis  
Keyword(3) Soft Switching  
Keyword(4) Development Method  
Keyword(5) Front Loading  
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1st Author's Name Soichiro Nakamura  
1st Author's Affiliation Smart Energy Laboratory Co., Ltd. (SEL)
2nd Author's Name Masatoshi Nakahara  
2nd Author's Affiliation Smart Energy Laboratory Co., Ltd. (SEL)
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Speaker Author-1 
Date Time 2023-01-19 13:15:00 
Presentation Time 50 minutes 
Registration for EE 
Paper # EE2022-36 
Volume (vol) vol.122 
Number (no) no.343 
Page pp.33-58 
#Pages 26 
Date of Issue 2023-01-12 (EE) 


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