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Paper Abstract and Keywords
Presentation 2023-03-01 14:25
Investigation of Loss Effects in LC Matching Circuits
Satoshi Tanaka, Takeshi Yoshida, Minoru Fujishima (Hiroshima Univ.) CAS2022-104 CS2022-81
Abstract (in Japanese) (See Japanese page) 
(in English) LC matching circuits are widely applied element circuits. As the data rate of wireless communication increases, widening the bandwidth has become a major issue for LC matching circuits. Multi-stage LC matching circuits are a representative technique for realizing broadband. In many cases, many elements are required for multi-stage, and miniaturization is an issue. There is a method of adding resistance as a method of expanding the band with a small number of elements, and this method is also widely applied. In this paper, we investigate the characteristics of the LC matching circuit with a resistor added, and discuss the advantages and disadvantages due to the difference in the connection method of the resistor.
Keyword (in Japanese) (See Japanese page) 
(in English) LC Matching / Loss / Passband / Resistor / / / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 396, CAS2022-104, pp. 47-52, March 2023.
Paper # CAS2022-104 
Date of Issue 2023-02-22 (CAS, CS) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CAS2022-104 CS2022-81

Conference Information
Committee CAS CS  
Conference Date 2023-03-01 - 2023-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Kitakyushu International Conference Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Network processor, Signal processing and circuits for communications, Wireless LAN / PAN, etc. 
Paper Information
Registration To CAS 
Conference Code 2023-03-CAS-CS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Investigation of Loss Effects in LC Matching Circuits 
Sub Title (in English)  
Keyword(1) LC Matching  
Keyword(2) Loss  
Keyword(3) Passband  
Keyword(4) Resistor  
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1st Author's Name Satoshi Tanaka  
1st Author's Affiliation Hiroshima University (Hiroshima Univ.)
2nd Author's Name Takeshi Yoshida  
2nd Author's Affiliation Hiroshima University (Hiroshima Univ.)
3rd Author's Name Minoru Fujishima  
3rd Author's Affiliation Hiroshima University (Hiroshima Univ.)
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Speaker Author-1 
Date Time 2023-03-01 14:25:00 
Presentation Time 25 minutes 
Registration for CAS 
Paper # CAS2022-104, CS2022-81 
Volume (vol) vol.122 
Number (no) no.396(CAS), no.397(CS) 
Page pp.47-52 
#Pages
Date of Issue 2023-02-22 (CAS, CS) 


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