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Paper Abstract and Keywords
Presentation 2023-04-10 11:00
[Invited Lecture] A 22nm 32Mb Embedded STT-MRAM Macro Achieving 5.9ns Random Read Access and 5.8MB/s Write Throughput at up to Tj of 150 °C
Takahiro Shimoi, Ken Matsubara, Tomoya Saito, Tomoya Ogawa, Yasuhiko Taito, Yoshinobu Kaneda, Masayuki Izuna, Koichi Takeda, Hidenori Mitani, Takashi Ito, Takashi Kono (Renesas Electronics) ICD2023-2
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents a high-precision sense amplifier and a fast write throughput technique of a 32Mb embedded STT-MRAM macro in a 22nm process for high-end microcontroller units. Boosted cross-couple sense amplifier achieves 5.1ns and 5.9ns random read access at Tj of 125°C and 150°C, respectively. A variable parallel bit write with fast voltage setup sequence enables 5.8MB/s write throughput and 65-69% reduction in write energy consumption.
Keyword (in Japanese) (See Japanese page) 
(in English) STT-MRAM / fast random read operation / high write throughput / one-time-programmable / high-end MCU / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 1, ICD2023-2, pp. 7-7, April 2023.
Paper # ICD2023-2 
Date of Issue 2023-04-03 (ICD) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ICD2023-2

Conference Information
Committee ICD  
Conference Date 2023-04-10 - 2023-04-11 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2023-04-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A 22nm 32Mb Embedded STT-MRAM Macro Achieving 5.9ns Random Read Access and 5.8MB/s Write Throughput at up to Tj of 150 °C 
Sub Title (in English)  
Keyword(1) STT-MRAM  
Keyword(2) fast random read operation  
Keyword(3) high write throughput  
Keyword(4) one-time-programmable  
Keyword(5) high-end MCU  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takahiro Shimoi  
1st Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
2nd Author's Name Ken Matsubara  
2nd Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
3rd Author's Name Tomoya Saito  
3rd Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
4th Author's Name Tomoya Ogawa  
4th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
5th Author's Name Yasuhiko Taito  
5th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
6th Author's Name Yoshinobu Kaneda  
6th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
7th Author's Name Masayuki Izuna  
7th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
8th Author's Name Koichi Takeda  
8th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
9th Author's Name Hidenori Mitani  
9th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
10th Author's Name Takashi Ito  
10th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
11th Author's Name Takashi Kono  
11th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
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Speaker Author-1 
Date Time 2023-04-10 11:00:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # ICD2023-2 
Volume (vol) vol.123 
Number (no) no.1 
Page p.7 
#Pages 1 
Date of Issue 2023-04-03 (ICD) 

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