IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2023-07-28 15:30
Deep Learning Approach for OSS Reliability Assessment Based on Data Preprocessing Considering the Wiener Process
Yoshinobu Tamura (Yamaguchi Univ.), Shigeru Yamada (Tottori Univ.) R2023-16
Abstract (in Japanese) (See Japanese page) 
(in English) In many open source software, the development style based on the database of general bug tracking systems is the normal development paradigm. In this paper, we propose the method of reliability assessment based on the deep learning by using the fault big data obtained from the bug tracking system. Traditionally, there are many research papers in terms of the reliability assessment method by using the fault count data prediction inspired from the time series analysis based on neural network. However, in such fault count data prediction, it has been difficult to estimate the cumulative fault detected count data. In this paper, we discuss the prediction accuracy of deep learning by using the data preprocessing based on the Wiener process.
Keyword (in Japanese) (See Japanese page) 
(in English) Open Source Software / Data Preprocessing / Wiener Process / Big Data / Deep Learning / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 141, R2023-16, pp. 33-38, July 2023.
Paper # R2023-16 
Date of Issue 2023-07-21 (R) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2023-16

Conference Information
Committee R  
Conference Date 2023-07-28 - 2023-07-28 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability Theory, Communication Network Reliability, Reliability General 
Paper Information
Registration To R 
Conference Code 2023-07-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Deep Learning Approach for OSS Reliability Assessment Based on Data Preprocessing Considering the Wiener Process 
Sub Title (in English)  
Keyword(1) Open Source Software  
Keyword(2) Data Preprocessing  
Keyword(3) Wiener Process  
Keyword(4) Big Data  
Keyword(5) Deep Learning  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yoshinobu Tamura  
1st Author's Affiliation Yamaguchi University (Yamaguchi Univ.)
2nd Author's Name Shigeru Yamada  
2nd Author's Affiliation Tottori University (Tottori Univ.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2023-07-28 15:30:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2023-16 
Volume (vol) vol.123 
Number (no) no.141 
Page pp.33-38 
#Pages
Date of Issue 2023-07-21 (R) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan