Paper Abstract and Keywords |
Presentation |
2023-10-31 13:55
Fundamental Study on Fault Analysis Based on Glitch Injection into Phase-Locked Loop Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2023-55 ICD2023-34 |
Abstract |
(in Japanese) |
(See Japanese page) |
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(Not available yet) |
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Reference Info. |
IEICE Tech. Rep., vol. 123, no. 235, HWS2023-55, pp. 5-9, Oct. 2023. |
Paper # |
HWS2023-55 |
Date of Issue |
2023-10-24 (HWS, ICD) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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HWS2023-55 ICD2023-34 |
Conference Information |
Committee |
ICD HWS |
Conference Date |
2023-10-31 - 2023-10-31 |
Place (in Japanese) |
(See Japanese page) |
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(See Japanese page) |
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Hardware Security, etc. |
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Registration To |
HWS |
Conference Code |
2023-10-ICD-HWS |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
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(See Japanese page) |
Title (in English) |
Fundamental Study on Fault Analysis Based on Glitch Injection into Phase-Locked Loop |
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1st Author's Name |
Hikaru Nishiyama |
1st Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
2nd Author's Name |
Daisuke Fujimoto |
2nd Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
3rd Author's Name |
Yuichi Hayashi |
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Nara Institute of Science and Technology (NAIST) |
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Speaker |
Author-1 |
Date Time |
2023-10-31 13:55:00 |
Presentation Time |
25 minutes |
Registration for |
HWS |
Paper # |
HWS2023-55, ICD2023-34 |
Volume (vol) |
vol.123 |
Number (no) |
no.235(HWS), no.236(ICD) |
Page |
pp.5-9 |
#Pages |
5 |
Date of Issue |
2023-10-24 (HWS, ICD) |
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