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Paper Abstract and Keywords
Presentation 2023-11-01 15:10
[Invited Talk] Thermal and non-thermal equilibrium process of charge carrier extraction in metal/insulator/organic Semiconductor/metal (MIOM) Junction
Hiroyuki Tajima, Takeshi Oda (Univ. Hyogo), Tomofumi Kadoya (Konan Univ.) OME2023-47
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents the concept and experimental evidence of the non-thermal equilibrium (NTE) process of charge-carrier extraction in metal/insulator/organic semiconductor/metal (MIOM) capacitors. These capacitors are structurally similar to metal/insulator/semiconductor/(metal) (MIS) capacitors found in standard textbooks. The difference between the two capacitors is that the (organic) semiconductor/metal contacts in MIOM capacitors are Schottky type, whereas the contacts in MIS capacitors are ohmic type. Moreover, the mobilities of most organic semiconductors are significantly lower than those of the inorganic semiconductors. As the MIOM structure is identical to the electrode portion of an organic field-effect transistor (OFET) with top-contact and bottom-gate electrodes, the hysteretic behavior of the OFET transfer characteristics can be deduced from the NTE phenomenon observed in MIOM capacitors.
Keyword (in Japanese) (See Japanese page) 
(in English) organic semiconductor / displacement current measurement / accumulated charge measurement / organic field-effect transistors / memory effect / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 237, OME2023-47, pp. 21-26, Nov. 2023.
Paper # OME2023-47 
Date of Issue 2023-10-25 (OME) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF OME2023-47

Conference Information
Committee OME  
Conference Date 2023-11-01 - 2023-11-01 
Place (in Japanese) (See Japanese page) 
Place (in English) JIBASAN Bidg. (Himeji) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Organic Devices, Sensors, etc. 
Paper Information
Registration To OME 
Conference Code 2023-11-OME 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Thermal and non-thermal equilibrium process of charge carrier extraction in metal/insulator/organic Semiconductor/metal (MIOM) Junction 
Sub Title (in English)  
Keyword(1) organic semiconductor  
Keyword(2) displacement current measurement  
Keyword(3) accumulated charge measurement  
Keyword(4) organic field-effect transistors  
Keyword(5) memory effect  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Hiroyuki Tajima  
1st Author's Affiliation University of Hyogo (Univ. Hyogo)
2nd Author's Name Takeshi Oda  
2nd Author's Affiliation University of Hyogo (Univ. Hyogo)
3rd Author's Name Tomofumi Kadoya  
3rd Author's Affiliation Konan University (Konan Univ.)
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Speaker Author-1 
Date Time 2023-11-01 15:10:00 
Presentation Time 35 minutes 
Registration for OME 
Paper # OME2023-47 
Volume (vol) vol.123 
Number (no) no.237 
Page pp.21-26 
#Pages 6 
Date of Issue 2023-10-25 (OME) 

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