Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2023-12-22 15:40
Characteristics of Break Arcs Generated between Cu, Al and Fe Electrical Contacts in a 100-280VDC/10A Resistive Circuit
Aoi Handa, Junya sekikawa (Shizuoka Univ.) EMD2023-38
Abstract (in Japanese) (See Japanese page) 
(in English) Break arcs were generated using Cu, Al, and Fe as electrical contacts in the resistive load circuit with supply voltage of 140-280 V and the current of 10A. Experiments were conducted using the same material for the cathode and the anode, as well as using different materials for the cathode and anode. The break arcs were observed by high-speed cameras. Following results were obtained. Using same materials for cathode and anode, the arc voltage increased with fluctuation only for using Al contacts. When the Fe contacts were used, the emission brightness of the break arcs was higher than when using the other Cu, and Al contact pairs. When different materials of Cu and Al were used for cathode and anode, when Al is used as the anode, the arc voltage increased with fluctuation. The brightness of the break arc was higher when Al was used as the anode than when Cu was used as the anode. The arc duration was slightly longer for cases of Al and Fe contact pairs than that for Cu contact pair. The anode material dominated the arc duration. It was shown that the characteristics of the break arcs were mainly influenced by the contact material used for the anode.
Keyword (in Japanese) (See Japanese page) 
(in English) Arc discharge / High-speed camera / Electro-magnetic relay / DC circuit / / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 324, EMD2023-38, pp. 35-40, Dec. 2023.
Paper # EMD2023-38 
Date of Issue 2023-12-15 (EMD) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2023-38

Conference Information
Committee EMD  
Conference Date 2023-12-22 - 2023-12-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Teikyo University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) IS-EMD, etc. 
Paper Information
Registration To EMD 
Conference Code 2023-12-EMD 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Characteristics of Break Arcs Generated between Cu, Al and Fe Electrical Contacts in a 100-280VDC/10A Resistive Circuit 
Sub Title (in English)  
Keyword(1) Arc discharge  
Keyword(2) High-speed camera  
Keyword(3) Electro-magnetic relay  
Keyword(4) DC circuit  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Aoi Handa  
1st Author's Affiliation Shizuoka University (Shizuoka Univ.)
2nd Author's Name Junya sekikawa  
2nd Author's Affiliation Shizuoka University (Shizuoka Univ.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2023-12-22 15:40:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2023-38 
Volume (vol) vol.123 
Number (no) no.324 
Page pp.35-40 
#Pages
Date of Issue 2023-12-15 (EMD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan