Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2024-01-19 13:30
Complex Permittivity Tensor Measurement by Millimeter-Wave Parallel Beam Transmission Method with Changing Incident Angle and In-Plane Rotation Angle
Ryutaro Oba, Atsuhiro Nishikata (Tokyo Tech), Masataka Midori, Hiroshi kurihara (TDK) EMCJ2023-95
Abstract (in Japanese) (See Japanese page) 
(in English) In the millimeter-wave parallel beam method using a dielectric lens, a change due to the in-plane anisotropy of the permittivity appears in the transmission S21 parameter when the sheet material is rotated around the beam axis. Also, by tilting the incident angle, a change due to thickness direction anisotropy appears. In a sheet material whose complex permittivity can be approximated as 1, we investigated and experimentally evaluated a method to estimate the six independent tensor elements of the principal-axis-transformed complex permittivity tensor by measuring the transmission S21 parameters by changing the in-plane rotation angle and the incidence angle, and evaluated the results by comparing them with the measured values.
Keyword (in Japanese) (See Japanese page) 
(in English) Parallel beam method / Permittivity tensor / Incidence angle / In-plane rotation angle / / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 346, EMCJ2023-95, pp. 43-48, Jan. 2024.
Paper # EMCJ2023-95 
Date of Issue 2024-01-12 (EMCJ) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2023-95

Conference Information
Committee EMCJ  
Conference Date 2024-01-19 - 2024-01-19 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2024-01-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Complex Permittivity Tensor Measurement by Millimeter-Wave Parallel Beam Transmission Method with Changing Incident Angle and In-Plane Rotation Angle 
Sub Title (in English)  
Keyword(1) Parallel beam method  
Keyword(2) Permittivity tensor  
Keyword(3) Incidence angle  
Keyword(4) In-plane rotation angle  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Ryutaro Oba  
1st Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
2nd Author's Name Atsuhiro Nishikata  
2nd Author's Affiliation Tokyo Institute of Technology (Tokyo Tech)
3rd Author's Name Masataka Midori  
3rd Author's Affiliation TDK Corporation (TDK)
4th Author's Name Hiroshi kurihara  
4th Author's Affiliation TDK Corporation (TDK)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2024-01-19 13:30:00 
Presentation Time 20 minutes 
Registration for EMCJ 
Paper # EMCJ2023-95 
Volume (vol) vol.123 
Number (no) no.346 
Page pp.43-48 
#Pages 6 
Date of Issue 2024-01-12 (EMCJ) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan