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Paper Abstract and Keywords
Presentation 2024-03-15 17:00
Investigation of Interference Voltage to Automotive Ethernet Transceiver IC in Powered ESD Test using Circuit Simulation
Toya Nakatani, Yusuke Yano, Jianqing Wang (NIT) EMCJ2023-111
Abstract (in Japanese) (See Japanese page) 
(in English) The International Electrotechnical Commission (IEC) has established an immunity evaluation method for automotive Ethernet transceiver ICs, which requires powered ESD testing to evaluate immunity to electrostatic discharge (ESD). In this study, first, the effect of powered ESD on the communication quality degradation of an automotive Ethernet transceiver IC was experimentally evaluated. Next, a test board and its LTspice simulation circuit were created to investigate the causes of communication errors, and the validity of the LTspice simulation circuit was verified by comparing the mixed-mode S-parameters between simulated and measured on the test board. Then, the interference voltages generated by the powered ESD test were analyzed using the verified LTspice simulation circuit, and the factors generating the communication errors were discussed.
Keyword (in Japanese) (See Japanese page) 
(in English) Ethernet / 100BASE-T1 / communication quality / immunity / powered ESD test / ESD / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 445, EMCJ2023-111, pp. 41-46, March 2024.
Paper # EMCJ2023-111 
Date of Issue 2024-03-08 (EMCJ) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2023-111

Conference Information
Committee EMCJ MICT  
Conference Date 2024-03-15 - 2024-03-15 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2024-03-EMCJ-MICT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Investigation of Interference Voltage to Automotive Ethernet Transceiver IC in Powered ESD Test using Circuit Simulation 
Sub Title (in English)  
Keyword(1) Ethernet  
Keyword(2) 100BASE-T1  
Keyword(3) communication quality  
Keyword(4) immunity  
Keyword(5) powered ESD test  
Keyword(6) ESD  
Keyword(7)  
Keyword(8)  
1st Author's Name Toya Nakatani  
1st Author's Affiliation Nagoya Institute of Technology (NIT)
2nd Author's Name Yusuke Yano  
2nd Author's Affiliation Nagoya Institute of Technology (NIT)
3rd Author's Name Jianqing Wang  
3rd Author's Affiliation Nagoya Institute of Technology (NIT)
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Speaker Author-1 
Date Time 2024-03-15 17:00:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2023-111 
Volume (vol) vol.123 
Number (no) no.445 
Page pp.41-46 
#Pages 6 
Date of Issue 2024-03-08 (EMCJ) 

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