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Paper Abstract and Keywords
Presentation 2024-07-22 17:55
A Machine Learning-Based Clone Detection Approach in Nano-Artifact Metrics
Naoki Yoshida, Iwaki Miyamoto, Katsunari Yoshioka (YNU), Tsutomu Matsumoto (AIST) ISEC2024-37 SITE2024-34 BioX2024-47 HWS2024-37 ICSS2024-41 EMM2024-43
Abstract (in Japanese) (See Japanese page) 
(in English) Artifact metrics is a technology that uses the physical characteristics of an artifact for authentication, and it is necessary to prepare for the threat of clones that impersonate a particular artifact. When an attacker creates a clone with high accuracy, it may have slightly different characteristics because it is created by a different method than the original manufacturing method, and it may be possible to determine in advance whether it is a clone or not, as in the case of biometric detection in face recognition. In this study, we investigate a method to detect clones by machine learning, using nanoartifact metrics based on the resist collapse phenomenon in electron-beam lithography as an example.
Keyword (in Japanese) (See Japanese page) 
(in English) Nano-Artifact Metrics / Clone Detection / Machine Learning / / / / /  
Reference Info. IEICE Tech. Rep., vol. 124, no. 122, BioX2024-47, pp. 188-193, July 2024.
Paper # BioX2024-47 
Date of Issue 2024-07-15 (ISEC, SITE, BioX, HWS, ICSS, EMM) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ISEC2024-37 SITE2024-34 BioX2024-47 HWS2024-37 ICSS2024-41 EMM2024-43

Conference Information
Committee EMM BioX ISEC SITE ICSS HWS IPSJ-CSEC IPSJ-SPT 
Conference Date 2024-07-22 - 2024-07-23 
Place (in Japanese) (See Japanese page) 
Place (in English) Sapporo Convention Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To BioX 
Conference Code 2024-07-EMM-BioX-ISEC-SITE-ICSS-HWS-CSEC-SPT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Machine Learning-Based Clone Detection Approach in Nano-Artifact Metrics 
Sub Title (in English)  
Keyword(1) Nano-Artifact Metrics  
Keyword(2) Clone Detection  
Keyword(3) Machine Learning  
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1st Author's Name Naoki Yoshida  
1st Author's Affiliation Yokohama National University (YNU)
2nd Author's Name Iwaki Miyamoto  
2nd Author's Affiliation Yokohama National University (YNU)
3rd Author's Name Katsunari Yoshioka  
3rd Author's Affiliation Yokohama National University (YNU)
4th Author's Name Tsutomu Matsumoto  
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
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Speaker Author-1 
Date Time 2024-07-22 17:55:00 
Presentation Time 25 minutes 
Registration for BioX 
Paper # ISEC2024-37, SITE2024-34, BioX2024-47, HWS2024-37, ICSS2024-41, EMM2024-43 
Volume (vol) vol.124 
Number (no) no.120(ISEC), no.121(SITE), no.122(BioX), no.123(HWS), no.124(ICSS), no.125(EMM) 
Page pp.188-193 
#Pages 6 
Date of Issue 2024-07-15 (ISEC, SITE, BioX, HWS, ICSS, EMM) 

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