Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2024-07-25 14:30
Debugging and testing of training datasets using internal activation states of CNN models
Daichi Ofuchi, Takumi Katsuie, Kozo Okano, Shinpei Ogata (Shinshu Univ.), Shin Nakajima (NII) SS2024-2 KBSE2024-8
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, Artificial Intelligence (AI) and machine learning technologies have made great achievements in various fields. The quality of AI software has become an important issue in integrating AI software into systems. There is a well-known method for debugging additional training datasets which improves the quality, especially robustness, of the model by calculating the Neuronal Coverage (NC) of the additional training datasets for the NN model, detecting outliers based on the results, and removing them. Therefore, in this paper, we extend the experiments of the previous study to CNN models and confirm the same results as in the previous study. We also confirmed that it is possible to construct an additional training dataset that improves the accuracy while maintaining the robustness using the method of the previous study.
Keyword (in Japanese) (See Japanese page) 
(in English) Machine Learning / Robustness / Testing / Neuron Coverage / / / /  
Reference Info. IEICE Tech. Rep., vol. 124, no. 133, SS2024-2, pp. 7-12, July 2024.
Paper # SS2024-2 
Date of Issue 2024-07-18 (SS, KBSE) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SS2024-2 KBSE2024-8

Conference Information
Committee KBSE SS IPSJ-SE  
Conference Date 2024-07-25 - 2024-07-27 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To SS 
Conference Code 2024-07-KBSE-SS-SE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Debugging and testing of training datasets using internal activation states of CNN models 
Sub Title (in English)  
Keyword(1) Machine Learning  
Keyword(2) Robustness  
Keyword(3) Testing  
Keyword(4) Neuron Coverage  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Daichi Ofuchi  
1st Author's Affiliation Shinshu University (Shinshu Univ.)
2nd Author's Name Takumi Katsuie  
2nd Author's Affiliation Shinshu University (Shinshu Univ.)
3rd Author's Name Kozo Okano  
3rd Author's Affiliation Shinshu University (Shinshu Univ.)
4th Author's Name Shinpei Ogata  
4th Author's Affiliation Shinshu University (Shinshu Univ.)
5th Author's Name Shin Nakajima  
5th Author's Affiliation National Institute of Informatics (NII)
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-2 
Date Time 2024-07-25 14:30:00 
Presentation Time 30 minutes 
Registration for SS 
Paper # SS2024-2, KBSE2024-8 
Volume (vol) vol.124 
Number (no) no.133(SS), no.134(KBSE) 
Page pp.7-12 
#Pages 6 
Date of Issue 2024-07-18 (SS, KBSE) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan