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Paper Abstract and Keywords
Presentation 2024-11-30 12:55
A Note on Interval Reliability Analysis of Intrusion-Tolerant Systems Using Phase Approximation
Junjun Zheng, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.) R2024-34
Abstract (in Japanese) (See Japanese page) 
(in English) This paper focuses on interval reliability analysis of intrusion-tolerant systems (ITS) with preventive maintenance under malicious attacks. The system’s behavior is described using a Markov regenerative process. Interval reliability provides a unified dependability measure that evaluates both reliability and availability, representing the probability that a system will remain operational over a finite time interval. This metric is especially critical for assessing fault tolerance and continuous operation capability in unstable environments. Meanwhile, phase approximation is a method for approximating complex non-exponential time transitions using multiple exponential distributions (i.e., phase-type distributions), making the analysis of system behavior under non-stationary conditions more mathematically tractable. In this paper, we analytically formulate the interval reliability of ITS using phase approximation.
Keyword (in Japanese) (See Japanese page) 
(in English) Interval reliability / Markov regenerative process / phase approximation / intrusion tolerance / preventive maintenance / / /  
Reference Info. IEICE Tech. Rep., vol. 124, no. 282, R2024-34, pp. 5-10, Nov. 2024.
Paper # R2024-34 
Date of Issue 2024-11-23 (R) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2024-34

Conference Information
Committee R  
Conference Date 2024-11-30 - 2024-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Toyooka Creative Community Plaza 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability of semiconductor and electronic devices, Reliability general 
Paper Information
Registration To R 
Conference Code 2024-11-R 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Note on Interval Reliability Analysis of Intrusion-Tolerant Systems Using Phase Approximation 
Sub Title (in English)  
Keyword(1) Interval reliability  
Keyword(2) Markov regenerative process  
Keyword(3) phase approximation  
Keyword(4) intrusion tolerance  
Keyword(5) preventive maintenance  
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1st Author's Name Junjun Zheng  
1st Author's Affiliation Hiroshima University (Hiroshima Univ.)
2nd Author's Name Hiroyuki Okamura  
2nd Author's Affiliation Hiroshima University (Hiroshima Univ.)
3rd Author's Name Tadashi Dohi  
3rd Author's Affiliation Hiroshima University (Hiroshima Univ.)
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Speaker Author-1 
Date Time 2024-11-30 12:55:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2024-34 
Volume (vol) vol.124 
Number (no) no.282 
Page pp.5-10 
#Pages 6 
Date of Issue 2024-11-23 (R) 

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