Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2025-07-11 09:35
Evaluation Method for Microleakage in Film Junction Using TE10-Mode Waveguide
Takayuki Matsumuro, Satoru Shimizu, Toshikazu Sakano (ATR) EMT2025-43 MW2025-56 OPE2025-46 EST2025-42 MWPTHz2025-56
Abstract (in Japanese) (See Japanese page) 
(in English) Highly conductive transparent and flexible radio wave reflective film is expected to be a promising electromagnetic wave shielding material, but the small leakage from the film bonding area is an issue. In this study, we propose a method to quantitatively evaluate the leakage loss at the bonding area by comparing the change in the internal Q-factor of a half-wavelength resonator formed by bonding a film to the aperture of a TE10-mode waveguide with a short-circuit condition. The effect of the thickness and width of the film bonding on the internal Q-factor is analyzed by electromagnetic field simulation, and the effectiveness of the proposed method is clarified.
Keyword (in Japanese) (See Japanese page) 
(in English) Film junction / Microleakage / TE10-mode waveguide / Q-factor / / / /  
Reference Info. IEICE Tech. Rep., vol. 125, no. 109, MW2025-56, pp. 183-186, July 2025.
Paper # MW2025-56 
Date of Issue 2025-07-03 (EMT, MW, OPE, EST, MWPTHz) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMT2025-43 MW2025-56 OPE2025-46 EST2025-42 MWPTHz2025-56

Conference Information
Committee EMT OPE EST MWPTHz MW IEE-EMT  
Conference Date 2025-07-10 - 2025-07-11 
Place (in Japanese) (See Japanese page) 
Place (in English) Okhotsk JA Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Workshop on Optical and Microwave technologies 
Paper Information
Registration To MW 
Conference Code 2025-07-EMT-OPE-EST-MWPTHz-MW-EMT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation Method for Microleakage in Film Junction Using TE10-Mode Waveguide 
Sub Title (in English)  
Keyword(1) Film junction  
Keyword(2) Microleakage  
Keyword(3) TE10-mode waveguide  
Keyword(4) Q-factor  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takayuki Matsumuro  
1st Author's Affiliation Advanced Telecommunications Research Institute International (ATR)
2nd Author's Name Satoru Shimizu  
2nd Author's Affiliation Advanced Telecommunications Research Institute International (ATR)
3rd Author's Name Toshikazu Sakano  
3rd Author's Affiliation Advanced Telecommunications Research Institute International (ATR)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2025-07-11 09:35:00 
Presentation Time 25 minutes 
Registration for MW 
Paper # EMT2025-43, MW2025-56, OPE2025-46, EST2025-42, MWPTHz2025-56 
Volume (vol) vol.125 
Number (no) no.108(EMT), no.109(MW), no.110(OPE), no.111(EST), no.112(MWPTHz) 
Page pp.183-186 
#Pages 4 
Date of Issue 2025-07-03 (EMT, MW, OPE, EST, MWPTHz) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan