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Paper Abstract and Keywords
Presentation 2025-07-17 14:35
Identification of malfunction origins caused by conducted disturbance at frequencies related to symbol rate of 1000BASE-T1 communicaton equipment
Akihiro Ikeda, Tohlu Matsushima, Daisuke Nakayama, Yuki Fukumoto (Kyutech) EMCJ2025-32
Abstract (in Japanese) (See Japanese page) 
(in English) In the conducted immunity measurement for the 1000BASE-T1 communication equipment, distinctive immunity behavior was found at some frequencies related to the symbol rate by the authors' research. Therefore, the authors tried to analyze where the errors occur and how they occur in this report. The authors used the Ethernet tester for the confirmation of errors and detected the position where the error occurred by comparing the results and the PHY status of 1000BASE-T1. The results showed that the malfunctions were caused by data corruption in the analog interface of the 1000BASE-T1 transceiver, which was caused by the failure of error correction.
Keyword (in Japanese) (See Japanese page) 
(in English) Immunity / Automotive Ethernet / 1000BASE-T1 / / / / /  
Reference Info. IEICE Tech. Rep., vol. 125, no. 117, EMCJ2025-32, pp. 43-48, July 2025.
Paper # EMCJ2025-32 
Date of Issue 2025-07-10 (EMCJ) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2025-32

Conference Information
Committee EMCJ  
Conference Date 2025-07-17 - 2025-07-17 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMCJ 
Conference Code 2025-07-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Identification of malfunction origins caused by conducted disturbance at frequencies related to symbol rate of 1000BASE-T1 communicaton equipment 
Sub Title (in English)  
Keyword(1) Immunity  
Keyword(2) Automotive Ethernet  
Keyword(3) 1000BASE-T1  
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1st Author's Name Akihiro Ikeda  
1st Author's Affiliation Kyushu Institute of Technology (Kyutech)
2nd Author's Name Tohlu Matsushima  
2nd Author's Affiliation Kyushu Institute of Technology (Kyutech)
3rd Author's Name Daisuke Nakayama  
3rd Author's Affiliation Kyushu Institute of Technology (Kyutech)
4th Author's Name Yuki Fukumoto  
4th Author's Affiliation Kyushu Institute of Technology (Kyutech)
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Speaker Author-1 
Date Time 2025-07-17 14:35:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2025-32 
Volume (vol) vol.125 
Number (no) no.117 
Page pp.43-48 
#Pages 6 
Date of Issue 2025-07-10 (EMCJ) 

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