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Paper Abstract and Keywords
Presentation 2025-11-14 17:05
Low-Voltage Design of a Charge Amplifier for Muon Imaging
Kakeru Fuchino, Takeshi Ohkawa, Masahiro Aoyagi (Kumamoto Univ.), Takeshi Kuboki (Hiroshima Univ.) HWS2025-71 ICD2025-36
Abstract (in Japanese) (See Japanese page) 
(in English) In recent years, a novel positioning technology utilizing cosmic-ray muons has attracted significant attention. Positioning systems based on cosmic-ray muons can acquire location information even in environments such as indoors, underground, and underwater, where conventional positioning systems using electromagnetic waves like GPS are difficult to operate. On the other hand, the development of readout circuits that can process charge signals induced by muon passage into voltage signals is required, and such circuits must operate at low voltage and low noise while being suitable for multi-channel configurations. In this study, an amplifier circuit used in the charge-sensitive amplifier of the readout circuit was designed, and the noise originating from MOSFETs was evaluated in terms of the equivalent noise charge (ENC). A performance comparison between 180-nm and 28-nm CMOS processes was conducted. The results showed that the amplifier area in the 28-nm CMOS process was 77% smaller, while the equivalent noise charge was 11.9 electrons for the 180-nm process and 12.0 electrons for the 28-nm process.
Keyword (in Japanese) (See Japanese page) 
(in English) Muon / Equivalent Noise Charge (ENC) / Readout Circuit / / / / /  
Reference Info. IEICE Tech. Rep., vol. 125, no. 249, ICD2025-36, pp. 48-53, Nov. 2025.
Paper # ICD2025-36 
Date of Issue 2025-11-07 (HWS, ICD) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF HWS2025-71 ICD2025-36

Conference Information
Committee ICD HWS  
Conference Date 2025-11-14 - 2025-11-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Kumamoto University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Hardware Security, etc. 
Paper Information
Registration To ICD 
Conference Code 2025-11-ICD-HWS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Low-Voltage Design of a Charge Amplifier for Muon Imaging 
Sub Title (in English)  
Keyword(1) Muon  
Keyword(2) Equivalent Noise Charge (ENC)  
Keyword(3) Readout Circuit  
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1st Author's Name Kakeru Fuchino  
1st Author's Affiliation Kumamoto University (Kumamoto Univ.)
2nd Author's Name Takeshi Ohkawa  
2nd Author's Affiliation Kumamoto University (Kumamoto Univ.)
3rd Author's Name Masahiro Aoyagi  
3rd Author's Affiliation Kumamoto University (Kumamoto Univ.)
4th Author's Name Takeshi Kuboki  
4th Author's Affiliation Hiroshima University (Hiroshima Univ.)
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Speaker Author-1 
Date Time 2025-11-14 17:05:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # HWS2025-71, ICD2025-36 
Volume (vol) vol.125 
Number (no) no.248(HWS), no.249(ICD) 
Page pp.48-53 
#Pages 6 
Date of Issue 2025-11-07 (HWS, ICD) 

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