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Paper Abstract and Keywords
Presentation 2026-04-17 15:25
Machine Learning based Causality Error Correction Model for the Impedance Corrected 2X-Thru De-Embedding
Hiroyuki Yoshinaga, Hiroshi Sato (Nisshinbo Microdevices) WPT2026-7 MW2026-7
Abstract (in Japanese) (See Japanese page) 
(in English) The impedance corrected 2X-Thru gives unexpected errors depending on the structure and RF properties of DUT. This paper describes that these errors are due to causal violations coming from truncated S-parameters used in the de-embedding process. To reduce the above-mentioned errors, we have developed a Causality Error Correction (CEC) model for de-embedding the DUT based on the machine learning technique. The newly developed model has reduced the causality errors successfully and improved the de-embedding accuracy for the DUT.
Keyword (in Japanese) (See Japanese page) 
(in English) 2x-thru / long short-term memory (LSTM) / S-parameters / machine learning / de-embedding / test fixture / /  
Reference Info. IEICE Tech. Rep., vol. 126, no. 6, MW2026-7, pp. 37-42, April 2026.
Paper # MW2026-7 
Date of Issue 2026-04-10 (WPT, MW) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF WPT2026-7 MW2026-7

Conference Information
Committee WPT MW  
Conference Date 2026-04-17 - 2026-04-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Aiport Sado 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Wireless Power Transfer, Microwave 
Paper Information
Registration To MW 
Conference Code 2026-04-WPT-MW 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Machine Learning based Causality Error Correction Model for the Impedance Corrected 2X-Thru De-Embedding 
Sub Title (in English)  
Keyword(1) 2x-thru  
Keyword(2) long short-term memory (LSTM)  
Keyword(3) S-parameters  
Keyword(4) machine learning  
Keyword(5) de-embedding  
Keyword(6) test fixture  
Keyword(7)  
Keyword(8)  
1st Author's Name Hiroyuki Yoshinaga  
1st Author's Affiliation Nisshinbo Microdevices Inc. (Nisshinbo Microdevices)
2nd Author's Name Hiroshi Sato  
2nd Author's Affiliation Nisshinbo Microdevices Inc. (Nisshinbo Microdevices)
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Speaker Author-1 
Date Time 2026-04-17 15:25:00 
Presentation Time 25 minutes 
Registration for MW 
Paper # WPT2026-7, MW2026-7 
Volume (vol) vol.126 
Number (no) no.5(WPT), no.6(MW) 
Page pp.37-42 
#Pages 6 
Date of Issue 2026-04-10 (WPT, MW) 

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