| Paper Abstract and Keywords |
| Presentation |
Bias-Voltage-Dependent Sub-Circuit Model for Evaluation of Nonlinear Characteristics in Millimeter-Wave CMOS Circuits
Kosuke Katayama (Hiroshima Univ.), Mizuki Motoyoshi (Tokyo Univ.), Shuhei Amakawa, Minoru Fujishima (Hiroshima Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
In this paper, we propose a new method for bias-dependent parameter extraction of MOSFET, which covers DC to over 100GHz. The DC MOSFET model provided by the chip foundry is assumed to be correct, and the core DC characteristics are designed to be asymptotically recovered at low frequencies. This is done by representing the corrections required at high-frequencies by a bias-dependent Y matrix, meaning that the parasitic nonlinear two-port (the Y-wrapper) is assumed to be connected in parallel with the core MOSFET. The Y-wrapper can also handle nonreciprocity of the parasitic components, that is, the asymmetry of the Y matrix. This flexible configuration is combined with a parameter extraction method in which only susceptances are used as target variables. The reliability of the Y-wrapper model is confirmed through simulation and measurement of a one-stage common-source amplifier operating at several biasing points. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Parameter extraction / MOSFET modeling / Millimeter-wave / / / / / |
| Reference Info. |
IEICE Tech. Rep. |
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| Conference Information |
| Committee |
MW |
| Conference Date |
2011-08-10 - 2011-08-12 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
KMITL, Ladkrabang, Thailand |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
RF, Microwave, and Millimeter-wave Theory and Techniques |
| Paper Information |
| Registration To |
MW |
| Conference Code |
2011-08-MW |
| Language |
English (Japanese title is available) |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Bias-Voltage-Dependent Sub-Circuit Model for Evaluation of Nonlinear Characteristics in Millimeter-Wave CMOS Circuits |
| Sub Title (in English) |
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| Keyword(1) |
Parameter extraction |
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MOSFET modeling |
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Millimeter-wave |
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| 1st Author's Name |
Kosuke Katayama |
| 1st Author's Affiliation |
Hiroshima University (Hiroshima Univ.) |
| 2nd Author's Name |
Mizuki Motoyoshi |
| 2nd Author's Affiliation |
The University of Tokyo (Tokyo Univ.) |
| 3rd Author's Name |
Shuhei Amakawa |
| 3rd Author's Affiliation |
Hiroshima University (Hiroshima Univ.) |
| 4th Author's Name |
Minoru Fujishima |
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Hiroshima University (Hiroshima Univ.) |
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