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Technical Committee on Silicon Device and Materials (SDM)  (Searched in: 2005)

Search Results: Keywords 'from:2005-08-18 to:2005-08-18'

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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 20 of 28  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, SDM 2005-08-18
08:30
Hokkaido HAKODATE KOKUSAI HOTEL A 95mW MPEG2 MP@HL Motion Estimation Processor Core for Portable High Resolution Video Application
Yuichiro Murachi (Kobe Univ.), Koji Hamano, Tetsuro Matsuno (Kanazawa Univ.), Junichi Miyakoshi (Kobe Univ.), Masayuki Miyama (Kanazawa Univ.), Masahiko Yoshimoto (Kobe Univ.)
This paper describes a 95mW MPEG2 MP@HL motion estimation processor core for portable and high resolution video applicat... [more] SDM2005-128 ICD2005-67
pp.1-6
ICD, SDM 2005-08-18
08:55
Hokkaido HAKODATE KOKUSAI HOTEL An Energy Reduction Method for FFT Circuits in Digital Wireless Communications Using Bitwidth Control
Masayuki Tokunaga, Kosuke Tarumi, Hiroto Yasuura (Kyushu Univ.)
Recently, digital wireless communication systems become very popular to use in portable devices. Low-energy system imple... [more] SDM2005-129 ICD2005-68
pp.7-12
ICD, SDM 2005-08-18
09:20
Hokkaido HAKODATE KOKUSAI HOTEL TIS Locking Circuit for Compensating LSI Performance by Temperature Variation
Goichi Ono, Masayuki Miyazaki, Kazuki Watanabe, Takayuki Kawahara (Hitachi, Ltd.)
(Advance abstract in Japanese is available) [more] SDM2005-130 ICD2005-69
pp.13-18
ICD, SDM 2005-08-18
09:45
Hokkaido HAKODATE KOKUSAI HOTEL A Digital Detector Design For Measuring Gate-Delay Variation
Ryota Sakamoto, Masanori Muroyama, Kosuke Tarumi, Hiroto Yasuura (Kyushu Univ.)
(Advance abstract in Japanese is available) [more] SDM2005-131 ICD2005-70
pp.19-24
ICD, SDM 2005-08-18
10:25
Hokkaido HAKODATE KOKUSAI HOTEL [Special Invited Talk] *
Makoto Yoshimi (SOITEC Asia)
 [more] SDM2005-132 ICD2005-71
pp.25-30
ICD, SDM 2005-08-18
11:10
Hokkaido HAKODATE KOKUSAI HOTEL Experimental Study on the Mobility Superiority in (110)-oriented Ultra-thin Body pMOSFETs
Gen Tsutsui, Masumi Saitoh, Toshiro Hiramoto (Univ. of Tokyo)
Ultra-thin body (UTB) SOI MOSFET is one of the most promising structures for future VLSIs because of its high short chan... [more] SDM2005-133 ICD2005-72
pp.31-36
ICD, SDM 2005-08-18
11:35
Hokkaido HAKODATE KOKUSAI HOTEL Variable body-factor FD SOI MOSFET for VTCMOS applications
Tetsu Ohtou, Toshiharu Nagumo, , Toshiro Hiramoto (Univ. Tokyo)
(Advance abstract in Japanese is available) [more] SDM2005-134 ICD2005-73
pp.37-42
ICD, SDM 2005-08-18
13:00
Hokkaido HAKODATE KOKUSAI HOTEL Measurement and evaluation of delay variation due to inductive and capacitive coupling noise
Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye (Osaka Univ.)
Capacitive coupling has been considered as a source of interconnect delay variation. Because of progressive increase in ... [more] SDM2005-135 ICD2005-74
pp.43-48
ICD, SDM 2005-08-18
13:25
Hokkaido HAKODATE KOKUSAI HOTEL Isolation Strategy against Substrate Coupling in CMOS Mixed-Signal/RF Circuits
Daisuke Kosaka, Makoto Nagata (Kobe Univ.), Yoshitaka Murasaka, Atsushi Iwata (A-R-Tec Corp.)
A deep n-well guard-ring, DNW-GR, provides effective isolation from substrate-coupled high frequency noises in combinati... [more] SDM2005-136 ICD2005-75
pp.49-54
ICD, SDM 2005-08-18
13:50
Hokkaido HAKODATE KOKUSAI HOTEL A Test Structure to Analyze (Highly-Doped)/(Lightly-Doped)-Drain in LDD-type CMOSFET
Takashi Ohzone (Okayama Pref. Univ.), Toshihiro Matsuda (Toyama Pref. Univ.), Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku (Okayama Pref. Univ.), Hideyuki Iwata (Toyama Pref. Univ.)
A test structure to separately measure sheet resistances of highly-doped-drain (HDD) and lightly- doped-drain (LDD) in L... [more] SDM2005-137 ICD2005-76
pp.55-60
ICD, SDM 2005-08-18
14:30
Hokkaido HAKODATE KOKUSAI HOTEL Delay Modeling and Static Timing Analysis for MTCMOS Circuits
Naoaki Ohkubo, Kimiyoshi Usami (Shibaura Institute of Tech.)
One of the critical issues in MTCMOS design is how to estimate a circuit delay quickly. In this paper, we propose a dela... [more] SDM2005-138 ICD2005-77
pp.61-66
ICD, SDM 2005-08-18
14:55
Hokkaido HAKODATE KOKUSAI HOTEL Monitoring Scheme for Minimizing Power Consumption by Means of Supply and Threshold Voltage Control in Active and Standby Modes
Yoshifumi Ikenaga, Masahiro Nomura, Koichi Takeda, Yoetsu Nakazawa (NEC), Yoshiharu Aimoto (NECEL), Yasuhiko Hagihara (NEC)
(Advance abstract in Japanese is available) [more] SDM2005-139 ICD2005-78
pp.67-72
ICD, SDM 2005-08-18
15:20
Hokkaido HAKODATE KOKUSAI HOTEL A Low Dynamic Power and Low Leakage Power CMOS Square-Root Circuit
Nobuaki Kobayashi, Tadayoshi Enomoto (Chuo Univ.)
(Advance abstract in Japanese is available) [more] SDM2005-140 ICD2005-79
pp.73-78
ICD, SDM 2005-08-18
15:45
Hokkaido HAKODATE KOKUSAI HOTEL A Low Leakage SRAM Macro with Replica Cell Biasing Scheme
Osamu Hirabayashi, Yasuhisa Takeyama, Hiroyuki Otake, Keiichi Kushida, Nobuaki Otsuka (Toshiba Corp.)
(Advance abstract in Japanese is available) [more] SDM2005-141 ICD2005-80
pp.79-84
ICD, SDM 2005-08-18
16:20
Hokkaido HAKODATE KOKUSAI HOTEL SOI; the Trump Card of SOCs in Sub. 50-nm Era -- Techniques that SOI Conquers Bulk! --
Tadayoshi Enomoto (Chuo Univ.), Takakuni Douseki (NTT), Kazutami Arimoto (Renesas), Jiroh Ida (Oki), Takashi Ipposhi (Renesas), Kazuhiko Miki (Toshiba), Masanao Yamaoka (Hitachi), Makoto Yoshimi (SOITEC)
(Advance abstract in Japanese is available) [more] SDM2005-142 ICD2005-81
pp.85-90
ICD, SDM 2005-08-19
08:30
Hokkaido HAKODATE KOKUSAI HOTEL A -90dBc@10kHz Phase Noise Fractional-N Frequency Synthesizer with Accurate Loop Bandwidth Control Circuit
Shiro Dosho, Takashi Morie, Koji Okamoto, Yuji Yamada, Kazuaki Sogawa (Matsushita Electric Industrial Co., Ltd)
This paper describes a -90dBc@10kHz phase noise fractional-N frequency synthesizer of 110M-180MHz output with accurate l... [more] SDM2005-143 ICD2005-82
pp.1-6
ICD, SDM 2005-08-19
08:55
Hokkaido HAKODATE KOKUSAI HOTEL A Low-IF CMOS Single-Chip Bluetooth EDR Transmitter with Digital I/Q Mismatch Trimming Circuit
Hiroki Ishikuro, Daisuke Miyashita, Taro Shimada, Shouhei Kousai, Hiroyuki Kobayashi, Hideaki Majima, Kenichi Agawa, Mototsugu Hamada, Fumitoshi Hatori (Toshiba)
A single-chip low-IF transmitter for the Bluetooth Enhanced Data Rate (max. 3Mbps) was fabricated in 0.18-um CMOS proces... [more] SDM2005-144 ICD2005-83
pp.7-12
ICD, SDM 2005-08-19
09:20
Hokkaido HAKODATE KOKUSAI HOTEL A 106dB audio digital-to-analog converter employing segment flipping technology combined with cascaded dynamic element matching
Toru Ido, Sonny Ishizuka (TIJ)
A 106dB stereo audio digital-to-analog converter having high power supply rejection and reduced jitter
sensitivity usin... [more]
SDM2005-145 ICD2005-84
pp.13-18
ICD, SDM 2005-08-19
10:00
Hokkaido HAKODATE KOKUSAI HOTEL [Special Invited Talk] HfSiON -- its high applicability as the alternative gate dielectric based on the high thermal stability and the remaining issue --
Akira Nishiyama, Masato Koyama, Yuuichi Kamimuta, Masahiro Koike, Ryosuke Iijima, Takeshi Yamaguchi, Masamichi Suzuki, Tsunehiro Ino, Mizuki Ono (Toshiba)
The decrease in the MOS device size has long been requiring the thinning of its gate dielectrics. In order to suppress t... [more] SDM2005-146 ICD2005-85
pp.19-24
ICD, SDM 2005-08-19
10:45
Hokkaido HAKODATE KOKUSAI HOTEL HfSiON Gate Dielectrics Design for Mixed Signal CMOS
Kenji Kojima, Ryosuke Iijima, Tatsuya Ohguro, Takeshi Watanabe, Mariko Takayanagi, Hisayo S. Momose, Kazunari Ishimaru, Hidemi Ishiuchi (TOSHIBA)
(Advance abstract in Japanese is available) [more] SDM2005-147 ICD2005-86
pp.25-30
 Results 1 - 20 of 28  /  [Next]  
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