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Technical Committee on Electromagnetic Compatibility (EMCJ) (Searched in: 2013)
Search Results: Keywords 'from:2013-07-12 to:2013-07-12'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ, EMD | 2013-07-12 10:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Degradation Phenomenon of Electrical Contacts using a Hammering Oscillation Mechanism or a Micro-Sliding Mechanism
-- A fundamental study on the performance of the hammering oscillation mechanism (28) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Hiroaki Kubota (TMC), Koichiro Sawa (NIT)  EMCJ2013-39 EMD2013-24 |
Authors have studied the effect on electrical contacts by actual micro-oscillation using the hammering oscillation mecha... [more] | EMCJ2013-39 EMD2013-24 pp.1-6 |
| EMCJ, EMD | 2013-07-12 11:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Thermodynamic and Transport Properties of Arc occurring between Ag contact pairs in CO2 atmosphere Takuya Hara, Junya Sekikawa (Shizuoka Univ.) EMCJ2013-40 EMD2013-25 |
The characteristic of an arc discharge phenomenon is influenced by many external conditions, such as gas pressure, gases... [more] | EMCJ2013-40 EMD2013-25 pp.7-12 |
| EMCJ, EMD | 2013-07-12 11:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | The Time Variation of Contact Resistance of Electrical Contacts after Contacting on Constant Contact Force Satoshi Ishikura, Junya Sekikawa (Shizuoka University) EMCJ2013-41 EMD2013-26 |
The time variation of contact resistance of electrical contacts after contacting on constant contact force is reported. ... [more] | EMCJ2013-41 EMD2013-26 pp.13-17 |
| EMCJ, EMD | 2013-07-12 11:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Position Changes of A Spot of Break Arc in a DC High-Voltage Circuit Kojun Konishi, Junya Sekikawa (Shizuoka Univ.) EMCJ2013-42 EMD2013-27 |
Silver contacts are separated at constant speed and break arc are generated in aDC100-450V and 2-10A resistive circuit. ... [more] | EMCJ2013-42 EMD2013-27 pp.19-23 |
| EMCJ, EMD | 2013-07-12 13:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Resistance fluctuation noise of a logarithmic
-- Leather resistance that varies logarithmically -- Masanobu Ban (Tokyo MLTC) EMCJ2013-43 EMD2013-28 |
Leather resistance gave higher voltage is recorded in units of milliseconds. Resistance change is recorded in a logarith... [more] | EMCJ2013-43 EMD2013-28 pp.25-27 |
| EMCJ, EMD | 2013-07-12 13:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Estimation of the Position that the External Electromagnetic Field Affect the Transmission Line by Measuring the Current at the End of Transmission Line Ryugo Date, Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) EMCJ2013-44 EMD2013-29 |
[more] | EMCJ2013-44 EMD2013-29 pp.29-32 |
| EMCJ, EMD | 2013-07-12 14:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | The flexible waveguide made by the braid technology Shinji Suesada, Tetsuhiko Murakami (ITC.Fukui) EMCJ2013-45 EMD2013-30 |
Since waveguide is non-flexible and heavy, it is inferior to coaxial cable in engineering works. The waveguide with ou... [more] |
EMCJ2013-45 EMD2013-30 pp.33-36 |
| EMCJ, EMD | 2013-07-12 15:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Basic Study of Circuit Network Modeling Method for Three Conductor VVF Cable Placing above Ground Plane Nobuo Kuwabara, Toshiya Uchida (KIT) EMCJ2013-46 EMD2013-31 |
Vinyl insulated Vinyl sheathed Flat-type cable (VVF cable) with three conductors is used for the indoor mono-phases powe... [more] | EMCJ2013-46 EMD2013-31 pp.37-42 |
| EMCJ, EMD | 2013-07-12 15:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Analysis of high-frequency components in electrostatic discharge events
-- Assessing the effect of discharge electrode material and relative humidity -- Masao Masugi (Ritsumeikan Univ.), Yuichiro Okugawa, Yoshiharu Akiyama (NTT), Kazuo Murakawa (NTT East) EMCJ2013-47 EMD2013-32 |
This report describes evaluations of electrostatic discharge (ESD) events from electromagnetic interference (EMI) aspect... [more] | EMCJ2013-47 EMD2013-32 pp.43-46 |
| EMCJ, EMD | 2013-07-12 15:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Special Talk]
EMC Technology Applied to Various Electronic Products Containing Large-sized Apparatus and Small Communication Facilities Naoto Oka (Mitsubishi Electric Corp.) EMCJ2013-48 EMD2013-33 |
EMC technology applied to various electronic products containing large-sized apparatus and small communication facilitie... [more] | EMCJ2013-48 EMD2013-33 pp.47-48 |
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